FQG4904 Datasheet, PDF (8/12 Pages) Fairchild Semiconductor – 400V Dual N & P-Channel MOSFET

Gate Charge Test Circuit & Waveform (N-Channel)
12V
10V
50KΩ
200nF
300nF
V_GS
Same Type
V_GS
as DUT
10V
V_DS
Q_gs
Q_g
Q_gd
DUT
3mA
Charge
Resistive Switching Test Circuit & Waveforms (N-Channel)
V_DS
V_GS
R_G
R_L
V_DD
V_DS
90%
DUT
V_GS ^10%
t_d(on)
t_r
t _on
Gate Charge Test Circuit & Waveform (P-Channel)
t_d(off)
t_f
t _off
Same Type
V_GS
50KΩ
as DUT
Q_g
12V
200nF
300nF
-10V
V_GS
V_DS
Q_gs
Q_gd
DUT
-3mA
Charge
Resistive Switching Test Circuit & Waveforms (P-Channel)
V_DS
V_GS
R_G
R_L
V_DD
t_d(on)
V_GS
10%
t _on
t_r
t _off
t_d(off)
t_f
-10V
©2002 Fairchild Semiconductor Corporation
DUT
V_DS
90%
Rev. A1, April 2002