FAN7384 Datasheet, PDF (5/17 Pages) Fairchild Semiconductor – Half-Bridge Gate-Drive IC

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be opera-
ble above the recommended operating conditions and stressing the parts to these levels is not recommended. In addi-
tion, extended exposure to stresses above the recommended operating conditions may affect device reliability. The
absolute maximum ratings are stress ratings only. T_A=25°C, unless otherwise specified.
Symbol
Parameter
Min.
Max.
Unit
V_S
V_B
V_HO
V_DD
V_IN
V_CSC
V_FO
dV_S/dt
P_D(2)(3)(4)
θ_JA
T_J
T_S
High-side offset voltage V_S
High-side floating supply voltage V_B
High-side floating output voltage
Low-side and logic-fixed supply voltage
Logic input voltage (HIN, LIN, SD)
Current sense input voltage
Fault output voltage
Allowable offset voltage slew rate
Power dissipation
Thermal resistance, junction-to-ambient
Junction temperature
Storage temperature
V_B-25
-0.3
V_S-0.3
-0.3
-0.3
-0.3
-0.3
-55
V_B+0.3
625
V_B+0.3
25
V_DD+0.3
V_DD+0.3
V_DD+0.3
50
1.0
110
150
150
V
V
V
V
V
V
V
V/ns
W
°C/W
°C
°C
Notes:
2. Mounted on 76.2 x 114.3 x 1.6mm PCB (FR-4 glass epoxy material).
3. Refer to the following standards:
JESD51-2: Integral circuits thermal test method environmental conditions - natural convection
JESD51-3: Low effective thermal conductivity test board for leaded surface mount packages
4. Do not exceed P_D under any circumstances.
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended
operating conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not
recommend exceeding them or designing to Absolute Maximum Ratings.
Symbol
Parameter
Condition
Min. Max. Unit
V_B
High-side floating supply voltage
V_S
High-side floating supply offset voltage
V_DD
Supply voltage
V_HO
High-side output voltage
V_LO
Low-side output voltage
V_IN
Logic input voltage (HIN, LIN, SD)
V_FO
Fault output voltage
T_A
Ambient temperature
V_S+13 V_S+20
V
6-V_DD
600
V
13
20
V
V_S
V_B
V
GND
V_DD
V
GND
V_DD
V
-0.3 V_DD+0.3
V
-40
125
°C
© 2006 Fairchild Semiconductor Corporation
FAN7384 Rev. 1.0.3
5
www.fairchildsemi.com