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| FQL40N50F Datasheet, PDF (4/8 Pages) Fairchild Semiconductor – 500V N-Channel MOSFET | |||
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1.2
1.1
1.0
0.9
0.8
-100
â» Notes :
1. VGS = 0 V
2. ID = 250 μ A
-50
0
50
100
150
200
TJ, Junction Temperature [oC]
Figure 7. Breakdown Voltage Variation
vs Temperature
103
Operation in This Area
is Limited by R DS(on)
102
100 µs 10 µs
1 ms
10 ms
101
DC
100
â» Notes :
1. TC = 25 oC
2. TJ = 150 oC
3. Single Pulse
10-1
100
101
102
103
V , Drain-Source Voltage [V]
DS
Figure 9. Maximum Safe Operating Area
3.0
2.5
2.0
1.5
1.0
0.5
0.0
-100
â» Notes :
1. V = 10 V
GS
2. ID = 20 A
-50
0
50
100
150
200
TJ, Junction Temperature [oC]
Figure 8. On-Resistance Variation
vs Temperature
40
30
20
10
0
25
50
75
100
125
150
TC, Case Temperature [â]
Figure 10. Maximum Drain Current
vs Case Temperature
1 0 -1
D = 0.5
0 .2
1 0 -2
0 .1
0 .05
0 .02
0 .01
sin g le p u ls e
â» N o tes :
1.
Zθ
(t)
JC
=
0 .2 7
â /W
M ax.
2 . D uty F acto r, D = t /t
12
3.
T
JM
-
T
C
=
P
DM
*
Zθ
(t)
JC
PDM
t1
t2
1 0 -5
1 0 -4
1 0 -3
1 0 -2
1 0 -1
100
101
t1, S q u a re W a v e P u ls e D u ra tio n [s e c ]
Figure 11. Transient Thermal Response Curve
©2001 Fairchild Semiconductor Corporation
Rev. A2, September 2001
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