74F657 Datasheet, PDF (4/7 Pages) NXP Semiconductors – Octal transceiver with 8-bit parit generator/checker

Absolute Maximum Ratings(Note 1)
Storage Temperature
−65°C to +150°C
Ambient Temperature under Bias
−55°C to +125°C
Junction Temperature under Bias
−55°C to +150°C
V_CC Pin Potential to Ground Pin
Input Voltage (Note 2)
−0.5V to +7.0V
−0.5V to +7.0V
Input Current (Note 2)
−30 mA to +5.0 mA
Voltage Applied to Output
in HIGH State (with V_CC = 0V)
Standard Output
3-STATE Output
−0.5V to V_CC
−0.5V to +5.5V
Current Applied to Output
in LOW State (Max)
twice the rated I_OL (mA)
Recommended Operating
Conditions
Free Air Ambient Temperature
Supply Voltage
0°C to +70°C
+4.5V to +5.5V
Note 1: Absolute maximum ratings are values beyond which the device
may be damaged or have its useful life impaired. Functional operation
under these conditions is not implied.
Note 2: Either voltage limit or current limit is sufficient to protect inputs.
DC Electrical Characteristics
Symbol
Parameter
Min
Typ
Max
Units
V_CC
Conditions
V_IH
Input HIGH Voltage
2.0
V_IL
Input LOW Voltage
V_CD
Input Clamp Diode Voltage
V_OH
Output HIGH
10% V_CC
2.5
Voltage
10% V_CC
2.4
10% V_CC
2.0
5% V_CC
2.7
5% V_CC
2.7
V_OL
Output LOW
10% V_CC
Voltage
10% V_CC
V
Recognized as a HIGH Signal
0.8
V
Recognized as a LOW Signal
−1.2
V
Min I_IN = −18 mA
I_OH = −1 mA (A_n)
I_OH = −3 mA (A_n B_n, Parity, ERROR)
V
Min I_OH = −15 mA (B_n, Parity, ERROR)
I_OH = −1 mA (A_n)
I_OH = −3 mA (A_n, B_n, Parity, ERROR)
0.5
I_OL = 24 mA (A_n)
V
Min
0.55
I_OL = 64 mA (B_n Parity, ERROR)
I_IH
Input HIGH
Current
20
µA
Max ^{VIN = 2.7V (ODD/EVEN)}
40
V_IN 2.7V (T/R, OE)
I_BVI
Input HIGH Current
Breakdown Test
100
µA
V_CC = 0 V_IN = 7.0V (T/R, OE, ODD/EVEN)
I_BVIT
Input HIGH Current
Breakdown Test (I/O)
1.0
mA
Max ^{VIN = 5.5V (Parity, Bn)}
2.0
V_IN = 5.5V (A_n)
I_IL
Input LOW
Current
−20
µA
Max ^{VIN = 0.5V (ODD/EVEN)}
−40
V_IN = 0.5V (T/R, OE)
I_OZH
Output Leakage Current
50
µA
Max V_OUT = 2.7V (ERROR)
I_OZL
I_IH + I_OZH
I_IL + I_OZL
I_OS
Output Leakage Current
Output Leakage
Current
Output Leakage
Current
Output Short-Circuit
Current
−60
−100
−50
µA
Max V_OUT = 0.5V (ERROR)
70
µA
Max ^{VI/O = 2.7V (Bn, Parity)}
90
V_I/O = 2.7V (A_n)
−70
µA
Max ^{VI/O = 0.5V (Bn, Parity)}
−90
V_I/O = 0.5V (A_n)
−150
mA
Max ^{VOUT = 0V (An)}
−225
V_OUT = 0V (B_n, Parity, ERROR)
I_CEX
Output HIGH Leakage
Current
250
µA
Max V_OUT = V_CC (ERROR)
1.0
mA
Max V_OUT = V_CC (B_n, Parity)
2.0
mA
Max V_OUT = V_CC (A_n)
I_ZZ
I_CCH
I_CCL
I_CCZ
Bus Drainage Test
Power Supply Current
Power Supply Current
Power Supply Current
500
µA
0.0V V_OUT = 5.25V (A_n, B_n, Parity, ERROR)
101
125
mA
Max V_O = HIGH
112
150
mA
Max V_O = LOW
109
145
mA
Max V_O = HIGH Z
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