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74ABT573_07 Datasheet, PDF (4/13 Pages) Fairchild Semiconductor – Octal D-Type Latch with 3-STATE Outputs
DC Electrical Characteristics
Symbol
VIH
VIL
VCD
VOH
VOL
IIH
IBVI
IIL
VID
IOZH
IOZL
IOS
ICEX
IZZ
ICCH
ICCL
ICCZ
ICCT
ICCD
Parameter
Input HIGH Voltage
Input LOW Voltage
Input Clamp Diode Voltage
Output HIGH Voltage
Output LOW Voltage
Input HIGH Current
Input HIGH Current Breakdown
Test
Input LOW Current
Input Leakage Test
Output Leakage Current
Output Leakage Current
Output Short-Circuit Current
Output HIGH Leakage Current
Bus Drainage Test
Power Supply Current
Power Supply Current
Power Supply Current
Additional
ICC/Input
Outputs Enabled
Outputs 3-STATE
Outputs 3-STATE
Dynamic ICC No Load(4)
VCC
Min.
Min.
Min.
Max.
Max.
Conditions
Recognized HIGH Signal
Recognized LOW Signal
IIN = –18mA
IOH = –3mA
IOH = –32mA
IOL = 64mA
VIN = 2.7V(4)
VIN = VCC
VIN = 7.0V
Max.
0.0
VIN = 0.5V(4)
VIN = 0.0V
IID = 1.9 µA, All Other Pins
Grounded
0–5.5V
0–5.5V
Max.
Max.
0.0
Max.
VOUT = 2.7V, OE = 2.0V
VOUT = 0.5V, OE = 2.0V
VOUT = 0.0V
VOUT = VCC
VOUT = 5.5V, All Others GND
All Outputs HIGH
Max. All Outputs LOW
Max. OE = VCC, All Others at VCC
or GND
Max.
Max.
VI = VCC – 2.1V
Enable Input VI = VCC – 2.1V
Data Input VI = VCC – 2.1V,
All Others at VCC or GND
Outputs Open, OE = GND,
LE = VCC(3), One-Bit Toggling,
50% Duty Cycle
Min.
2.0
2.5
2.0
4.75
–100
Typ.
Max. Units
V
0.8 V
–1.2 V
V
0.55 V
1
µA
1
7
µA
–1 µA
–1
V
10 µA
–10 µA
–275 mA
50 µA
100 µA
50 µA
30 mA
50 µA
2.5 mA
2.5 mA
2.5 mA
0.12 mA/
MHz
Notes:
3. For 8-bits toggling, ICCD < 0.8mA/MHz.
4. Guaranteed but not tested.
©1993 Fairchild Semiconductor Corporation
74ABT573 Rev. 1.4
4
www.fairchildsemi.com