FAN5354 Datasheet, PDF (3/14 Pages) Fairchild Semiconductor – 3MHz, 3A Synchronous Buck Regulator

Absolute Maximum Ratings
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be operable above
the recommended operating conditions and stressing the parts to these levels is not recommended. In addition, extended
exposure to stresses above the recommended operating conditions may affect device reliability. The absolute maximum
ratings are stress ratings only.
Symbol Parameter
SW, PVIN, VCC Pins
VIN
Other Pins
IC Not Switching
IC Switching
VINOV_SLEW Maximum Slew Rate of VIN Above 6.5V when PWM is Switching
RPGOOD Pull-Up Resistance from PGOOD to VCC
ESD
Electrostatic Discharge
Protection Level
Human Body Model per JESD22-A114
Charged Device Model per JESD22-C101
TJ
Junction Temperature
TSTG Storage Temperature
TL
Lead Soldering Temperature, 10 Seconds
Note:
3. Lesser of 7V or VCC+0.3V.
Min.
-0.3
-0.3
-0.3
1
–40
–65
Max.
7.0
6.5
VCC + 0.3⁽³⁾
15
2
2
+150
+150
+260
Units
V
V
V/ms
KΩ
KV
°C
°C
°C
Recommended Operating Conditions
The Recommended Operating Conditions table defines the conditions for actual device operation. Recommended operating
conditions are specified to ensure optimal performance to the datasheet specifications. Fairchild does not recommend
exceeding them or designing to Absolute Maximum Ratings.
Symbol
VCC, VIN
VOUT
IOUT
L
CIN
COUT
TA
TJ
Parameter
Supply Voltage Range
Output Voltage Range
Output Current
Inductor
Input Capacitor
Output Capacitor
Operating Ambient Temperature
Operating Junction Temperature
Min.
2.7
0.8
0
-40
-40
Typ.
0.47
10
20
Max.
5.5
90% Duty Cycle
3
+85
+125
Units
V
V
A
µH
µF
µF
°C
°C
Thermal Properties
Symbol Parameter
Min.
Typ.
Max.
Units
θJA
Junction-to-Ambient Thermal Resistance⁽⁴⁾
46
°C/W
Note:
4. Junction-to-ambient thermal resistance is a function of application and board layout. This data is measured with four-layer
1s2p boards in accordance to JESD51- JEDEC standard. Special attention must be paid not to exceed junction
temperature TJ(max) at a given ambient temperate TA.
© 2009 Fairchild Semiconductor Corporation
FAN5354 • Rev. 1.0.4
3
www.fairchildsemi.com