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IRFR110A Datasheet, PDF (2/7 Pages) Fairchild Semiconductor – Advanced Power MOSFET
IRFR/U110A
N-CHANNEL
POWER MOSFET
Electrical Characteristics (TC=25ΟC unless otherwise specified)
Symbol
BVDSS
∆ BV/∆TJ
VGS(th)
IGSS
IDSS
RDS(on)
gfs
Ciss
Coss
Crss
td(on)
tr
td(off)
tf
Qg
Qgs
Qgd
Characteristic
Drain-Source Breakdown Voltage
Breakdown Voltage Temp. Coeff.
Gate Threshold Voltage
Gate-Source Leakage , Forward
Gate-Source Leakage , Reverse
Drain-to-Source Leakage Current
Static Drain-Source
On-State Resistance
Forward Transconductance
Input Capacitance
Output Capacitance
Reverse Transfer Capacitance
Turn-On Delay Time
Rise Time
Turn-Off Delay Time
Fall Time
Total Gate Charge
Gate-Source Charge
Gate-Drain(“Miller”) Charge
Min. Typ. Max. Units
Test Condition
100 -- --
-- 0.12 --
2.0 -- 4.0
V
V/ ΟC
V
VGS=0V,ID=250 µA
ID=250µ A See Fig 7
VDS=5V,ID=250 µ A
-- -- 100 nA VGS=20V
-- -- -100
VGS=-20V
-- -- 10
VDS=100V
--
-- 100 µ A VDS=80V,TC=125ΟC
-- -- 0.4 Ω VGS=10V,ID=2.35A O4
-- 3.23 -- Ω VDS=40V,ID=2.35A O4
-- 190 240
--
55
65
VGS=0V,VDS=25V,f =1MHz
pF
See Fig 5
-- 21 25
-- 10 30
-- 14 40
VDD=50V,ID=5.6A,
-- 28 70 ns RG=24Ω
See Fig 13
O4 O5
-- 18 50
-- 8.5 12
VDS=80V,VGS=10V,
-- 1.6 -- nC ID=5.6A
-- 4.1 --
See Fig 6 & Fig 12 O4 O5
Source-Drain Diode Ratings and Characteristics
Symbol
IS
ISM
VSD
trr
Qrr
Characteristic
Continuous Source Current
Pulsed-Source Current
Diode Forward Voltage
Reverse Recovery Time
Reverse Recovery Charge
Min. Typ. Max. Units
Test Condition
--
O1 --
-- 4.7
Integral reverse pn-diode
A
-- 19
in the MOSFET
O4 -- -- 1.5 V TJ=25ΟC ,IS=4.7A,VGS=0V
-- 85 -- ns TJ=25ΟC ,IF=5.6A
-- 0.23 -- µ C diF/dt=100A/ µ s
O4
Notes ;
O1 Repetitive Rating : Pulse Width Limited by Maximum Junction Temperature
O2 L=4mH, IAS=4.7A, VDD=25V, RG=27Ω , Starting TJ =25oC
O3 ISD <_ 5.6A, di/dt <_250A/ µs, V DD <_ BVDSS , Starting TJ =25 oC
O4 Pulse Test : Pulse Width = 250 µs, Duty Cycle <_2%
O5 Essentially Independent of Operating Temperature