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HFA50HF20 Datasheet, PDF (2/5 Pages) Fairchild Semiconductor – Ultrafast, Soft Recovery Diode | |||
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HFA50HF20
Electrical Characteristics (per Leg) @ TJ = 25°C (unless otherwise specified)
Parameter
Min. Typ. Max. Units
Test Conditions
VBR
Cathode Anode Breakdown Voltage
200 â â V IR = 100µA
VFM
Max Forward Voltage
0.88 0.96
IF = 50A
â 0.98 1.11 V IF = 100A
See Fig. 1
0.75 0.84
IF = 50A, TJ = 125°C
IRM
Max Reverse Leakage Current
â â 10 µA VR = VR Rated
See Fig. 2
â â 1.0 mA TJ = 125°C, VR = 160V
CT
Junction Capacitance
â 170 310 pF VR = 200V
See Fig. 3
LS
Series Inductance
â 2.8 â nH Measured from center of bond pad to
end of anode bonding wire
Dynamic Recovery Characteristics (per Leg) @ TJ = 25°C (unless otherwise specified)
trr
trr1
trr2
IRRM1
IRRM2
Qrr1
Qrr2
di(rec)M/dt1
di(rec)M/dt2
Parameter
Reverse Recovery Time
Peak Recovery Current
Reverse Recovery Charge
Peak Rate of Fall of Recovery Current
During tb
Min. Typ. Max. Units
Test Conditions
â 35 â
IF = 1.0A, dif/dt = 200A/µs, VR = 30V
â 62 93 ns TJ = 25°C See Fig.
â 98 150
TJ = 125°C
5
IF = 50A
â 10 18
â 14 26
A TJ = 25°C See Fig.
TJ = 125°C
6
VR = 200V
â 260 390 nC TJ = 25°C See Fig.
â 640 960
TJ = 125°C
7 dif/dt = 200A/µs
â 600 900 A/µs TJ = 25°C See Fig.
â 980 1500
TJ = 125°C
8
Lead Assignments :
1 - Cathode
2, 3 - Anode
IR Case Style SMD-1
Dimensions in millimeters and (inches)
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