FOD410 Datasheet, PDF (2/12 Pages) Fairchild Semiconductor – 6-Pin DIP Zero-Cross Triac Drivers

Absolute Maximum Ratings (T_A = 25°C unless otherwise noted)
Stresses exceeding the absolute maximum ratings may damage the device. The device may not function or be
operable above the recommended operating conditions and stressing the parts to these levels is not recommended.
In addition, extended exposure to stresses above the recommended operating conditions may affect device reliability.
The absolute maximum ratings are stress ratings only.
Symbol
Parameters
Device
Value
Units
TOTAL DEVICE
T_STG
T_OPR
T_SOL
T_J
V_ISO
Storage Temperature
Operating Temperature
Lead Solder Temperature (Wave)
Junction Temperature Range
Isolation Test Voltage⁽¹⁾
(rms AC voltage, 60Hz, 1 min. duration)
All
-55 to +150
°C
All
-55 to +100
°C
All
260 for 10 sec
°C
All
125
°C
All
5000
Vac(rms)
P_D Total Device Power Dissipation @ 25°C
Derate above 25°C
All
500
mW
8.3
mW/°C
EMITTER
I_F
Continuous Forward Current
V_R Reverse Voltage
P_D Total Power Dissipation 25°C Ambient
Derate above 25°C
All
30
mA
All
6
V
All
50
mW
5.4
mW/°C
DETECTOR
V_DRM Off-State Output Terminal Voltage
FOD410, FOD4116
600
V
FOD4108, FOD4118
800
I_TSM Peak Non-Repetitive Surge Current
(single cycle 60Hz sine wave)
All
3
A
I_TM Peak On-State Current
P_D Total Power Dissipation @ 25°C Ambient
Derate above 25°C
All
300
mA
All
450
mW
6.25
mW/°C
Note:
1. Isolation voltage, V_ISO, is an internal device dielectric breakdown rating. For this test, Pins 1, 2 and 3 are common,
and Pins 4, 5 and 6 are common.
©2004 Fairchild Semiconductor Corporation
FOD410, FOD4108, FOD4116, FOD4118 Rev. 1.1.4
2
www.fairchildsemi.com