100ELT23 Datasheet, PDF (2/5 Pages) Fairchild Semiconductor – 5V Dual Differential PECL to TTL Translator (Preliminary)

Preliminary
Absolute Maximum Ratings(Note 1)
PECL Supply Voltage (V_CC)
Input Voltage (V_I) V_I ≤ V_CC
Storage Temperature (T_STG)
Thermal Resistance
0.0V to +7V
0.0V to + 6V
−65°C to + 150°C
Junction to Ambient (θ_JA) SOIC
Junction to Case (θ_JC) SOIC
Junction to Ambient (θ_JA) MSOP
Junction to Case (θ_JC) MSOP
0LFPM
500LFPM
std bd
0LFPM
500LFPM
std bd
TBD
TBD
TBD
TBD
TBD
TBD
Recommended Operating
Conditions
Power Supply Operating
V_CC = 4.75V to 5.25V
ECL Input Voltage
0.0V to V_CC
Free Air Operating Temperature (T_A)
−40°C to +85°C
Note 1: The “Absolute Maximum Ratings” are those values beyond which
the safety of the device cannot be guaranteed. The device should not be
operated at these limits. The parametric values defined in the Electrical
Characteristics tables are not guaranteed at the absolute maximum rating.
The “Recommended Operating Conditions” table will define the conditions
for actual device operation.
PECL DC Electrical Characteristics V_CC = 5.0V; GND = 0.0V (Note 2)
Symbol
Parameter
−40°C
25°C
85°C
Units
Min Typ Max Min Typ Max Min Typ Max
V_IH
V_IL
V_IHCMR
Input HIGH Voltage (Single Ended)
Input LOW Voltage (Single Ended)
Input HIGH Voltage Common
Mode Range (Differential) (Note 3)
3835
3190
2.2
4120
3525
3835
3190
5.0
2.2
4120
3525
3835
3190
5.0
2.2
4120 mV
3525 mV
5.0
V
I_IH
Input HIGH Current
150
I_IL
Input LOW Current
0.5
0.5
Note 2: V_IH and V_IL values vary 1 to 1 with V_CC. V_CC can vary ±0.25V.
Note 3: V_IHCMR minimum varies 1 to 1 with GND. V_IHCMR maximum varies 1 to 1 with V_CC.
150
0.5
150
µA
µA
Note: Devices are designed to meet the DC specifications after thermal equilibrium has been established. Circuit is tested with air flow greater than
500LFPM maintained.
TTL DC Electrical Characteristics V_CC = 5.0V; GND = 0.0V (Note 4)
Symbol
Parameter
T_A = −40°C to 85°C
Min
Typ
Max
Units
Condition
V_OH
Output HIGH Voltage
2.4
V_OL
Output LOW Voltage
I_CCH
Power Supply Current (Outputs set to HIGH)
23
I_CCL
Power Supply Current (Outputs set to LOW)
26
I_OS
Output Short Circuit Current (Note 5)
−150
Note 4: V_CC can vary ±0.25V.
V
I_OH = −3.0 mA
0.5
V
I_OL = 24 mA
33
mA
36
mA
−60
mA
Note 5: For I_OS, the use of high-speed test apparatus and/or sample-and-hold techniques are preferable in order to minimize internal chip heating and more
accurately reflect operational values. Otherwise, prolonged shorting of a HIGH output may raise the chip temperature well above normal and thereby cause
invalid readings in other parameter tests. In any sequence of parameter tests, I_OS tests should be performed last.
Note: Devices are designed to meet the DC specifications after thermal equilibrium has been established. Circuit is tested with air flow greater than
500LFPM maintained.
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