FOD3184S Datasheet, PDF (12/23 Pages) Fairchild Semiconductor – 3A Output Current, High Speed MOSFET/IGBT Gate Driver Optocoupler

Test Circuit
Pulse Generator
PW = 4.99ms
Period = 5ms
R_OUT = 50Ω
Pulse-In
LED-IFmon
Test Conditions:
Frequency = 200Hz
Duty Cycle = 99.8%
VDD = 15V to 30V
VSS = 0V
VF(OFF) = -3.0V to 0.8V
1
2
R2
100Ω
3
4
R1
100Ω
C1 ^{+ C2}
0.1µF
47µF
Power Supply
+
V_DD = 15V to 30V
8
7
6
V_OL
5
Iol
D1
C3 ⁺
0.1µF
+
C4
47µF
Power Supply
V = 6V
To Scope
Figure 20. I_OL Test Circuit
Pulse Generator
PW = 10µs
Period = 5ms
R_OUT = 50Ω
Pulse-In
LED-IFmon
Test Conditions:
Frequency = 200Hz
Duty Cycle = 0.2%
VDD = 15V to 30V
VSS = 0V
IF = 10mA to 16mA
1
2
R2
100Ω
3
4
R1
100Ω
C1 ^{+ C2}
0.1µF
47µF
Power Supply
+
V_DD = 15V to 30V
8
7
6
V_OH
5
Ioh
D1
Current
Probe
C3 ⁺
0.1µF
+
C4
47µF
–
Power Supply
V = 6V
To Scope
Figure 21. I_OH Test Circuit
©2005 Fairchild Semiconductor Corporation
FOD3184 Rev. 1.0.4
12
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