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STM32F205RFT6 Datasheet, PDF (98/178 Pages) List of Unclassifed Manufacturers – ARM-based 32-bit MCU, 150DMIPs, up to 1 MB Flash/128+4KB RAM, USB OTG HS/FS, Ethernet, 17 TIMs, 3 ADCs, 15 comm. interfaces & camera
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Electrical characteristics
STM32F20xxx
6.3.13
Symbol
Table 39. Flash memory programming with VPP
Parameter
Conditions
Min(1) Typ
tprog
Double word programming
-
16
tERASE16KB Sector (16 KB) erase time
tERASE64KB Sector (64 KB) erase time
tERASE128KB Sector (128 KB) erase time
TA = 0 to +40 °C
VDD = 3.3 V
VPP = 8.5 V
-
230
-
490
-
875
tME
Mass erase time
-
6.9
Vprog
Programming voltage
2.7
-
VPP
VPP voltage range
7
-
IPP
Minimum current sunk on
the VPP pin
10
-
tVPP(3)
Cumulative time during
which VPP is applied
-
-
1. Guaranteed by design, not tested in production.
2. The maximum programming time is measured after 100K erase operations.
3. VPP should only be connected during programming/erasing.
Max(1) Unit
100(2) µs
-
-
ms
-
-
s
3.6
V
9
V
-
mA
1 hour
Symbol
Table 40. Flash memory endurance and data retention
Parameter
Conditions
Value
Min(1)
NEND Endurance
TA = –40 to +85 °C (6 suffix versions)
TA = –40 to +105 °C (7 suffix versions)
10
1 kcycle(2) at TA = 85 °C
30
tRET Data retention 1 kcycle(2) at TA = 105 °C
10
10 kcycles(2) at TA = 55 °C
20
1. Based on characterization, not tested in production.
2. Cycling performed over the whole temperature range.
Unit
kcycles
Years
EMC characteristics
Susceptibility tests are performed on a sample basis during device characterization.
Functional EMS (electromagnetic susceptibility)
While a simple application is executed on the device (toggling 2 LEDs through I/O ports).
the device is stressed by two electromagnetic events until a failure occurs. The failure is
indicated by the LEDs:
• Electrostatic discharge (ESD) (positive and negative) is applied to all device pins until
a functional disturbance occurs. This test is compliant with the IEC 61000-4-2 standard.
• FTB: A burst of fast transient voltage (positive and negative) is applied to VDD and VSS
through a 100 pF capacitor, until a functional disturbance occurs. This test is compliant
with the IEC 61000-4-4 standard.
A device reset allows normal operations to be resumed.
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