5962-89637 Datasheet, PDF (5/10 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, LINEAR, WIDEBAND RMS-TO-DC CONVERTER, MONOLITHIC SILICON

TABLE I. Electrical performance characteristics.
Conditions
Test
Symbol
+VS = +15 V, -VS = -15 V
-55°C ≤ TA ≤+125°C
unless otherwise specified
Total error
Total error versus
positive supply
Total error versus
negative supply
ET
VIN = 0 V to ±10 V
∆ ET
∆ + VS
∆ ET
∆ - VS
+5.0 V ≤ +VS ≤ +15 V
-5.0 V ≤ -VS ≤ -15 V
DC reversal error
2.0 V fullscale
nonlinearity
7.0 V fullscale
nonlinearity
Output offset voltage
ETR
VIN = ±2.0 V, TA = +25°C
NL1
10 mV ≤ |VIN| ≤ 2.0 V
NL2
10 mV ≤ |VIN| ≤ 7.0 V
VOSO VIN = GND
Output offset voltage
temperature coefficient
Output voltage swing
at RMS OUT
IREF0
2/
for 0 dB = 1.0 V rms
IREF range
2/
Buffer input offset
voltage
Buffer input current
Denominator input
resistance
2/
Denominator input
offset voltage 2/
Power supply range
Quiescent current
Standby current
∆VOSO
∆T
VOP
IREF1
IREF2
VOS2
IIN
RDEN
VOS3
VS
IQ
ISB
VIN = GND
RL = 2.0 kΩ
TA = 25°C
TA = 25°C
TA = 25°C
TA = 25°C
TA = 25°C
TA = 25°C
TA = 25°C
VS = ±18 V
VCS ≤ 0.2 V, TA = +25°C
Group A
Device
subgroups type
1
01
2, 3
1, 2, 3
01
1
01
2
1
01
1
01
2, 3
1
01
2, 3
1
01
2, 3
2, 3
01
1, 2, 3
01
1
01
1
01
1
01
1
01
4
01
1
01
1
01
1, 2, 3
01
1
01
Limits
Unit
Min
12
5.0
1.0
20
±3.0
Max
1/
1/
±150
1/
µV/V
±300
µV/V
±500
±.25
±.04
±.06
±.05
±.14
±1.0
±6.0
±.07
% of
reading
% of FS
% of FS
mV
mV/°C
V
80
µA
100
µA
±2.0
mV
±10
nA
30
kΩ
±0.5
mV
±18
V
3.0
mA
450
µA
1/ For subgroup 1, the maximum total error is ±1.0 mV ±0.5% of reading. For subgroup 2 and 3, the maximum total error is ±6.0
mV ±0.7% of reading. Total error represents the maximum deviation of the dc component of the output voltage from the
theoretical output value over a specified range of signal amplitude and frequency. It is shown as the sum of a fixed error and a
component proportional to the theoretical output (percentage of reading). The fixed error component includes all offset errors
and irreducible nonlinearities; the percentage of reading component includes the linear scale-factor error.
2/ If not tested, shall be guaranteed to the limits specified in table I.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
B
5962-89637
SHEET
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