HC49153020SR3RDBUT Datasheet, PDF (28/31 Pages) List of Unclassifed Manufacturers – SPECIFYING QUARTZ CRYSTALS

SC CUT CRYSTALS: CFPX-2000 SERIES
ISSUE 1; 18 MAY 1998
n _{The CFPX-2000 series of SC cut quartz resonators}
are double rotated crystals that offer considerable ad-
vantages over single rotated AT or BT cuts for certain
applications. The term SC stands for “Stress Com-
pensated” and it was the property of compensation for
thermal transient and planar stress effects that was
sought in its orginal development. The frequency/tem-
perature characteristics of the SC cut are most suit-
able for oven controlled oscillator applications for
precision frequency control.
Key Features:
n _{Thermal transient compensation - fast warm up}
n _{Low frequency/temperature response slope suitable}
for ovened applications
n _{Smooth frequency/temperature characteristics reduce}
coupled mode problems
n _{Low thermal hysteresis}
n _{Ageing as low as 1 × 10}^-10_{/day at 85°C (3rd overtone)}
can be achieved
n _{Low acceleration sensitivity}
n _{Q factor > 1.2 million for 10MHz 3rd overtone crystal}
Environmental Specification:
n _{Bump: IEC 68-2-29 Test Eb, 4000 ±10 bumps at}
400m/ s² (40gn) in each of three mutually perpendicu-
lar planes
n _{Vibration: IEC 68-2-6 Test Fc Procedure B4}
(MIL-STD-202 Method 204), Duration 12 hours, 10
to 55Hz 0.75mm D.A., 55 to 2000Hz 98m/s² (10gn)
n _{Shock: IEC 68-2-27 Test Ea, (MIL-STD-202}
Method 213) ½ sine wave, 981m/s² (100gn) 11ms, 6
shocks in each plane
n _{Damp Heat: IEC 68-2-3 Test Ca (Steady State), Du-}
ration 56 days, recovery time 12 hours
n _{Change of temperature: IEC 68-2-14 Test Na (Rapid}
Change) (MIL-STD-202 Method 107), 10 cycles of
30 mintues duration each for -55/+125°C cycle
n _{Solderability: IEC 68-2-20 Test Ta Method1 (Solder}
Bath) (MIL-STD-202 Method 208), Temperature
235°C
n _{Robustness of Termination: IEC 68-2-21 Test Ua}
(Tensile or Thrust)(MIL-STD-202 Method 211), 10
Newtons (Tensile) or 20 Newtons (Thrust)
n _{Hermetic Seal: IEC 68-2-17 Test Qk (Fine Leak),}
(MIL-STD-202 Method 112 Test condition C) and
IEC 68-2-17 Test Qc (Gross Leak) (MIL-STD-202
Method 112 Test condition D)
n _{Marking: Heat cured epoxy or engraving}
Frequency\Holder Range
Frequency
Range
8.0 to 50.0MHz
30.0 to 150.0MHz
5.0 to 20.0MHz
8.0 to 20.0MHz
1.5 to 10.0MHz
4.0 to 20.0MHz
Mode
Fundamental
3rd Overtone
Fundamental
3rd Overtone
Fundamental
3rd Overtone
Holder
HC35/U (TO5)
HC45/U
HC37/U (TO8)
HC40/U
HC36/U
IEC Code
DK
EB
DL
DU, DM, DR
DN
General Characteristics
n _{Turnover temperature: 50 to 85°C}
105 to 125°C
n _{Ageing: < 5 × 10}^-9_{/day at 85°C (fundamental)}
< 1 × 10^-9/day at 85°C (3rd overtone)
Note: Tighter specifications available
n _{Q - factor: > 1.2 million for 10MHz 3rd overtone}
n _{g - sensitivity: < 1 × 10}^-9_{/g typical for HC35, HC37 or}
HC40
Note: These holders employ 4-point mounting and are
recommended where low g - sensitivity is a requirement
n _{Material: Swept premium Q, low inclusion density}
n _{To determine your exact requirements please contact}
our Applications Support Department
Outline in mm (inches) - HC35/U (TO5) DK -
(scale 1.5:1)
8 .5 m a x
(0 .3 3 5 m a x )
6 .6 m a x
(0 .2 6 0 m a x )
Æ ^{0 .4 /0 .4 8}
(_Æ 0 .0 1 6 /0 .0 1 9 )
1 2 .7 m in
(0 .5 0 0 m in )
4 .9 3 /5 .2 3
(0 .1 9 4 /0 .2 0 6 )
T a g p o s itio n
o r p re s e n c e
o p tio n a l
0 .8 7 m a x
(0 .0 3 4 m a x )
1
2
3
1 0 .7 m a x
(0 .4 2 1 m a x )
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