57C128FB Datasheet, PDF (10/13 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, MEMORY, DIGITAL, CMOS, 16K X 8-BIT ULTRA VIOLET

4.3 Quality conformance inspection. Quality conformance inspection shall be in accordance with method 5005 of MIL-STD-
883 including groups A, B, C, and D inspections. The following additional criteria shall apply.
4.3.1 Group A inspection.
a. Tests shall be as specified in table II herein.
b. Subgroups 5 and 6 in table I, method 5005 of MIL-STD-883 shall be omitted.
c. Subgroup 4 (C_IN and C_OUT measurement) shall be measured only for the initial test and after process or design changes
which may affect capacitance. Sample size is fifteen devices with no failures and all input and output terminals tested.
d. All devices selected for testing shall have a checkerboard pattern or equivalent. After completion of all testing, the
devices shall be verified and erased (except devices submitted for groups C and D testing).
e. Subgroups 7, 8A, and 8B shall include verification of the truth table.
TABLE II. Electrical test requirements. 1/ 2/ 3/
MIL-STD-883 test requirements
Subgroups (in accordance with
method 5005, table I)
Interim electrical parameters
---
(method 5004)
Final electrical test parameters
(method 5004)
1*, 2, 3, 7, 8A, 8B, 9, 10, 11
Group A test requirements
(method 5005)
1, 2, 3, 4**, 7, 8A, 8B, 9, 10, 11
Groups C and D end-point electrical
parameters (method 5005)
2, 8A, 10
or
1, 2, 3
1/ * Indicates PDA applies to subgroups 1.
2/ Any or all subgroups may be combined when using high-speed testers.
3/ ** See 4.3.1c.
4.3.2 Groups C and D inspections.
a. End-point electrical parameters shall be as specified in table II herein.
b. Steady-state life test conditions, method 1005 of MIL-STD-883.
(1) Test condition A, B, C, or D. The test circuit shall be maintained by the manufacturer under document revision level
control and shall be made available to the preparing activity upon request. The test circuit shall specify the inputs,
outputs, biases, and power dissipation, as applicable, in accordance with the intent specified in method 1005 of MIL-
STD-883.
(2) T_A = +125C, minimum.
(3) Test duration: 1,000 hours, except as permitted by method 1005 of MIL-STD-883.
c. All devices selected for testing shall be programmed with a checkerboard pattern, then verified and erased.
4.4 Erasing procedures. The recommended erasing procedure shall be as specified by the device manufacturer and shall be
made available upon request.
4.5 Programming procedures. The programming procedures shall be as specified by the device manufacturer and shall be
made available upon request.
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43218-3990
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
G
5962-87661
SHEET
10