3D3428 Datasheet, PDF (7/7 Pages) List of Unclassifed Manufacturers – MONOLITHIC 8-BIT PROGRAMMABLE DELAY LINE

SILICON DELAY LINE AUTOMATED TESTING
3D3428
TEST CONDITIONS
INPUT:
Ambient Temperature: 25^oC ± 3^oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
Period:
PW_IN = 1.25 x Total Delay
PER_IN = 2.5 x Total Delay
OUTPUT:
R_load:
C_load:
Threshold:
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Device
Under
Test
10KΩ
470Ω
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
GENERATOR
OUT
TRIG
IN DEVICE UNDER
TEST (DUT)
OUT
REF
IN
DIGITAL SCOPE/
TRIG ^{TIME INTERVAL COUNTER}
Figure 6: Test Setup
t_RISE
PW_IN
PER_IN
t_FALL
INPUT
2.4
V_IH
2.4
SIGNAL
1.5
0.6
1.5
0.6
V_IL
t_PLH
t_PHL
OUTPUT
SIGNAL
V_OH
1.5
1.5
V_OL
Figure 7: Timing Diagram
Doc #04004
DATA DELAY DEVICES, INC.
7
11/1/04
3 Mt. Prospect Ave. Clifton, NJ 07013