MV04E050T101 Datasheet, PDF (4/9 Pages) List of Unclassifed Manufacturers – Multilayer Chip Varistor for Surge

Multilayer Chip Varistor for Surge and
ESD Protection – E Type Series
Document No TMVE-XXOS001C
Issued date
2012/02/13
Page
4/9
6. Reliability Test
Environmental
Specification
Test Method and Description
High Temperature
Storage/ Dry Heat
The specimen shall be subjected to 150 ± 2℃ for 1000 ± 12 hours in a
thermostatic bath without load and then stored at room temperature and
humidity for 1 to 2 hours. Therefore, the change of varistor voltage shall be
measured.
Temperature Cycle
The temperature cycle of specified
temperature shall be repeated five
times and then stored at room
temperature and humidity for one or
two hours. The change of varistor
voltage and mechanical damage shall
be examined.
Step
1
2
3
4
Temperature
-40±3
Room
Temperature
125±3
Room
Temperature
Period
30Min±3
1 hour
30Min±3
1 hours
High Temperature Load ^{After being continuously applied the maximum allowable voltage at 85 ± 2℃}
for 1000± 2 hours, the specimen shall be stored at room temperature and
Dry Heat Load
humidity for one or two hours, Therefore the change of varistor voltage should
be measured.
Damp Heat Load/
Humidity Load
Low Temperature
Storage/ Cold
The specimen should be subjected to 40± 2℃, 90 to 95﹪ RH and the
maximum allowable voltage for 500 hours and then stored at room temperature
and humidity for one or two hours. Therefore the change of varistor voltage
should be measured.
The specimen should be subjected to -50 ± 2℃, without load for 500 hours and
then stored at room temperature for one or two hours. Therefore the change of
varistor voltage should be measured.
Direct contact
electrostatic discharge
1.Discharge: contact electrostatic discharge; 2.Voltage：8KV（Level4）
3.Polarity：+,- ; 4.Number: 10 times ; 5.Interval time：1sec
Direct air electrostatic
discharge
1.Discharge: air electrostatic discharge; 2.Voltage：15KV（Level4）
3.Polarity：+,-; 4.Number: 10 times; 5.Interval time：1~ 3sec
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