8407201RA Datasheet, PDF (14/17 Pages) List of Unclassifed Manufacturers – MICROCIRCUIT, DIGITAL, HIGH-SPEED CMOS, OCTAL TRANSPARENT D-TYPE LATCHES WITH THREE STATE OUTPUTS MONOLITIC SILICON

c. CIN shall be measured only for initial qualification and after process or design changes which may affect capacitance.
CIN shall be measured between the designated terminal and GND at a frequency of 1 MHz. CPD shall be tested in
accordance with the latest revision of JEDEC Standard No. 20 and table I herein. For CIN and CPD, test all applicable
pins on five devices with zero failures.
TABLE II. Electrical test requirements.
Test requirements
Interim electrical
parameters (see 4.2)
Final electrical
parameters (see 4.2)
Group A test
requirements (see 4.4)
Group C end-point electrical
parameters (see 4.4)
Group D end-point electrical
parameters (see 4.4)
Group E end-point electrical
parameters (see 4.4)
Subgroups
(in accordance with
MIL-STD-883,
method 5005, table I)
Device
class M
---
Subgroups
(in accordance with
MIL-PRF-38535, table III)
Device
class Q
---
Device
class V
1
1, 2, 3, 7, 9 1/
1/ 1, 2, 3, 7, 9
1, 2, 3, 4, 7, 9, 10, 11
2/
1, 2, 3
1, 2, 3, 4, 7,
8, 9, 10, 11
1, 2, 3
1, 2, 3
1, 2, 3
2/ 3/ 1, 2, 3, 7,
8, 9, 10, 11
1, 2, 3, 4, 7,
8, 9, 10, 11
3/ 1, 2, 3, 7,8,
9, 10, 11
1, 2, 3
1, 7, 9
1, 7, 9
1, 7, 9
1/ PDA applies to subgroup 1.
2/ PDA applies to subgroups 1, 7 and deltas.
3/ Delta limits as specified in table III shall be required where specified and the delta limits shall be completed
with reference to the zero hour electrical parameters.
Table III. Burn-in and operating life test delta parameters (+25°C)
Parameter
Quiescent current
Input current low level
Input current high level
Output voltage low level
(IOL = 6 mA, VCC = 4.5 V)
Output voltage high level
(IOH = -6 mA, VCC = 4.5 V)
Symbol
ICC
IIL
IIH
VOL
VOH
Delta Limits
±120 nA
±20 nA
±20 nA
±0.026 V
±0.20 V
STANDARD
MICROCIRCUIT DRAWING
DEFENSE SUPPLY CENTER COLUMBUS
COLUMBUS, OHIO 43216-5000
DSCC FORM 2234
APR 97
SIZE
A
REVISION LEVEL
F
84072
SHEET
14