AU9510F_05 Datasheet, PDF (13/17 Pages) List of Unclassifed Manufacturers – USB Smart Card Reader Controller

5.6 Latch-Up Test Results
Test Description: Latch-Up testing was performed at room ambient using an
IMCS-4600 system which applies a stepped voltage to one pin per device with all
other pins open except Vdd and Vss which were biased to 5Volts and ground
respectively.
Testing was started at 5.0V (Positive) or 0V (Negative), and the DUT was biased for
0.5 seconds.
If neither the PUT current supply nor the device current supply reached the
predefined limit (DUT=00mA, Icc=100mA), then the voltage was increased by
0.1Volts and the pin was tested again.
This procedure was recommended by the JEDEC JC-40.2 CMOS Logic
standardization committee.
Notes:
1. DUT: The device under test.
2. PUT: The pin under test.
Figure 5.2 Latch-Up Test Results Diagram
Test Circuit: Positive Input/Output Overvoltage/Overcurrent
Test Circuit: Negative Input/Output Overvoltage/Overcurrent
AU9510F USB Smart Card Reader Controller V2.00
Official Release-Public
Page 13 of 17