AU9510F_05 Datasheet, PDF (12/17 Pages) List of Unclassifed Manufacturers – USB Smart Card Reader Controller

5.4 Crystal Oscillator Circuit Setup for
Characterization
The following setup was used to measure the open loop voltage gain for crystal oscillator
circuits. The feedback resistor serves to bias the circuit at its quiescent operating point and
the AC coupling capacitor, Cs, is much larger than C1 and C2.
Figure 5.1 Crystal Oscillator Circuit Setup for Characterization
5.5 ESD Test Results
Test Description: ESD Testing was performed on a Zapmaster system using the
Human-Body-Model (HBM) and Machine-Model (MM), according to MIL-STD 883 and EIAJ
IC-121 respectively.
• Human-Body-Model stresses devices by sudden application of a high voltage supplied by a
100pF capacitor through 1.5k-ohm resistance.
• Machine-Model stresses devices by sudden application of a high voltage supplied by a
200pF capacitor through very low (0 ohm) resistance.
Test Circuit & Condition
- Zap Interval: 1 second
- Number of Zaps: 3 positive and 3 negative at room temperature
- Criteria: I-V Curve Tracing
Model
HBM
MM
Mode
Vdd, Vss, I/C
Vdd, Vss, I/C
Table 5.4 ESD Data
S/S
15
15
Target
6000V
200V
Results
PASS
PASS
AU9510F USB Smart Card Reader Controller V1.07W
Official Release-Public
Page 12 of 17