EDD10323BBH-LS Datasheet, PDF (10/60 Pages) Elpida Memory – 1G bits DDR Mobile RAM™ WTR (Wide Temperature Range), Low Power Function

EDD10323BBH-LS
Test Conditions
Parameter
Input high voltage
Input low voltage
Input differential voltage, CK and /CK inputs
Input differential cross point voltage,
CK and /CK inputs
Input signal slew rate
Output load
Note: 1. VDD = VDDQ
tCK
tCH
tCL
/CK
CK
Symbol
VIH (AC)
VIL (AC)
VID (AC)
VIX (AC)
SLEW
CL
VID
VIX
tLZ
tAC
Value
0.8 × VDDQ
0.2 × VDDQ
1.4
VDDQ/2 with VDD=VDDQ
1
15
Unit
V
V
V
V
V/ns
pF
Note
1
1
1
1
VIH
VIL
T
slew rate = ^{(VIH − VIL)}
T
DQOUT
(DQOUT)
Q1
Q2
VDDQ/2
Test Condition (Wave form and Timing Reference)
DQ
CL
Output Load
Preliminary Data Sheet E1435E20 (Ver. 2.0)
10