4N51 Datasheet, PDF (7/7 Pages) Opto Electronics Co,. LTD – HERMETIC , NUMERIC AND HEXADECIMAL

4N51, 4N52,
67023 4N53, 4N54
Test
Subgroup 1
Resistance to Solvents
Internal Visual and Mechanical ⁽¹⁰⁾
Subgroup 2^(1,2)
Solderability
Subgroup 3
Thermal Shock (Temp. Cycle)
Moisture Resistance⁽³⁾
Fine Leak
Gross Leak
Electrical / Optical Endpoints⁽⁴⁾
Subgroup 4
Operating Life Test (340 hrs.)⁽⁵⁾
Electrical / Optical Endpoints⁽⁴⁾
HERMETIC, NUMERIC AND HEXIDECIMAL DISPLAYS
TABLE III
GROUP B, CLASS A AND B OF MIL-PRF-87157
MIL-PRF-750 Conditions
Sample Size
Method
1022
2075
4 Devices / 0 Failures
1 Device / 0 Failures
2026
1051
1021
1071
1071
------
1027
------
T_A = 245°C for 5 seconds
Condition B1, 15 Min. Dwell
Condition H
Condition C
I_V, I_CC, I_BL, I_BH, I_EL, I_EH, I_IL, I_IH and
visual function. T_A = 25°C
T_A = 100°C, at V_CC = 5.0V and
cycling through logic at 1 character
per second.
Same as Subgroup 3
LTPD = 15
LTPD = 15
LTPD = 10
Subgroup 5
Non-operating (Storage) Life
Test (340 hrs.)
Electrical / Optical Endpoints⁽⁴⁾
1032
------
T_A = 125°C
Same as Subgroup 3
LTPD = 10
Test
Subgroup 1
Physical Dimensions
Subgroup 2^{(2, 10)}
Lead Integrity
Fine Leak
Gross Leak
TABLE IV
GROUP C, CLASS A AND B OF MIL-PRF-87157
MIL-PRF-750 Conditions
Method
2066
2004
1071
1071
Condition B2
Condition H
Condition C
Sample Size
2 Devices / 0 Failures
LTPD = 15
Subgroup 3
Shock
Vibration, Variable Frequency
Constant Acceleration
External Visual⁽⁷⁾
Electrical / Optical Endpoints⁽⁴⁾
Subgroup 4^(1,6)
Salt Atmosphere
External Visual⁽⁷⁾
2016
2056
2006
1010 or 1011
------
1041
1010 or 1011
1500G, Time = 0.5 ms, 5 blows in
each orientation X₁, Y₁, Z₁
10,000G at Y₁ orientation
I_V, I_CC, I_BL, I_BH, I_EL, I_EH, I_IL, I_IH and
visual function. T_A = 25°C
LTPD = 15
LTPD = 15
Subgroup 5
Bond Strength⁽⁸⁾
2037
Condition A
LTPD = 20 (c = 0)
Subgroup 6
Operating Life Test⁽⁹⁾
Electrical / Optical Endpoints⁽⁴⁾
1026
------
T_A = +100°C 1000 HRS
Same as Subgroup 3
LTPD = 10
NOTES: 1. Whenever electrical/optical tests are not required as endpoints, electrical rejects may be used.
2. The LTPD applies to the number of leads inspected, except in no case shall less than 3 displays be used to provide the number of leads required.
3. Initial conditioning should be a 15” bend inward one cycle.
4. Limits and conditions are per the electrical/optical characteristics.
5. Burn-in for the over range shall use Condition B at a nominal I_F = 8 mA with “+1” illuminated for t=340 hours.
6. Solderability samples shall not be used.
7. Visual requirements shall be as specified in MIL-PRF-883, Methods 1010 or 1011.
8. Displays may be selected prior to seal.
9. If a given inspection lot, undergoing Group B inspection, has been selected to satisfy the Group C inspection requirements, the 340 hour life tests may
be continued on test to 1000 hours in order to satisfy the Group C Life Test requirements. In such cases, either the 340 hour endpoint measurements
shall be made a basis for Group B lot acceptance or the 1000 hour endpoint measurement shall be used as the basis for both Group B and Group C
acceptance.
10. MIL-PRF-883 test method applies.
MICROPAC INDUSTRIES, INC. OPTOELECTRONIC PRODUCTS DIVISION • 725 E. Walnut St., Garland, TX 75040 • [phone] • Fax [phone]
www.micropac.com E-MAIL: [e-mail]
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