OSE-1L7 Datasheet, PDF (3/4 Pages) Opto Electronics Co,. LTD – INFRARED EMITTING DIODE

OSE-1L7
INFRARED EMITTING DIODE
■ Reliability Test Items
CONDITIONS :
The reliability of products shall be satisfied with items listed below .
NO.
Item
1 Soldering Heat Test
2 Thermal Shock
3 High Temp. Storage
Condition Time / Cycle
260℃
0℃ (15 sec) ~
100℃ (15 sec)
100℃
5 sec
20 cycle
1000 Hrs
Number of
Damaged
0/60
0/60
0/60
4 Low Temp. Storage
-25℃
1000 Hrs
0/60
5 Operation Temperature Cycle TEST -25℃ ~ 75℃
100 Cycles ,
200Hrs
0/60
6 High Temp. High Humidity Test 60℃ , 90% RH 1000 Hrs
0/60
7 Operation Life Test
Room Temp.
50mA
1000 Hrs
0/60
■ Dimemsions
SIGN : 1. CATHODE
SIGN : 2. ANODE
UNIT : mm
光電企業有限公司
March 2006
Rev 1.1