MA28151 Datasheet, PDF (16/22 Pages) Dynex Semiconductor – Radiation hard Programmable Communication Interface

MA28151
6. DC CHARACTERISTICS AND RATINGS
Parameter
Supply Voltage
Input Voltage
Current Through Any Pin
Operating Temperature
Storage Temperature
Min
Max Units
-0.5
7
V
-0.3 V_DD+0.3
V
-20
+20
mA
-55
125
°C
-65
150
°C
Figure 25: Absolute Maximum Ratings
Note: Stresses above those listed may cause permanent
damage to the device. This is a stress rating only and
functional operation of the device at these conditions, or at
any other condition above those indicated in the operations
section of this specification, is not implied. Exposure to
absolute maximum rating conditions for extended periods
may affect device reliability.
Total dose radiation not
exceeding 3x10⁵ Rad(SI)
Symbol
Parameter
Conditions
Min Typ Max Units
V_DD Supply Voltage
-
V_IH
Input High Voltage
-
V_IL
Input Low Voltage
-
V_OH Output High Voltage
I_OH = -2mA
V_OL Output Low Voltage
I_OL = 5mA
I_IN
Input Leakage Current (Note 1)
V_DD = 5.5V,
V_IN = V_SS or V_DD
I_OZ
Tristate Leakage Current (Note 1)
V_DD = 5.5V,
V_IN = V_SS or V_DD
I_DD
Power Supply Current
Static, V_DD = 5.5V
V_DD = 5V±10%, over full operating temperature range.
Mil-Std-883, method 5005, subgroups 1, 2, 3
Note 1: Guaranteed but not tested at -55°C
4.5
5.0
5.5
V
2.2
-
-
V
-
-
0.8
V
V_DD-0.5 -
-
V
-
- V_SS+0.4 V
-
-
±10 µA
-
-
±50 µA
-
0.1
10
mA
Figure 26: Electrical Characteristics
Subgroup
1
2
3
7
8A
8B
9
10
11
Definition
Static characteristics specified in Figure 26 at +25°C
Static characteristics specified in Figure 26 at +125°C
Static characteristics specified in Figure 26 at -55°C
Functional characteristics specified in Figure 24 at +25°C
Functional characteristics specified in Figure 24 at +125°C
Functional characteristics specified in Figure 24 at -55°C
Switching characteristics specified in Figure 23 at +25°C
Switching characteristics specified in Figure 23 at +125°C
Switching characteristics specified in Figure 23 at -55°C
Figure 27: Definition of Mil-Std-883, Method 5005 Subgroups
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