MA1916 Datasheet, PDF (10/11 Pages) Dynex Semiconductor – Radiation Hard Reed-Solomon & Convolution Encoder

MA1916
MSG_OUT 28
CLK_OUT 27
SMC 26
RSE_OUT 25
SYZ 24
T3 23
CLKS 22
VDD 21
N/C 20
T0 19
MSG 18
CLK 17
READY 16
SMC_OUT 15
Bottom
View
1 T2
2 T1
3 CE_CLKS
4 CE_IN
5 CE_OUT
6 TEST_POINT
7 N/C
8 ST1
9 GND
10 SEL_A
11 STZ
12 SEL_B
13 SZY
14 n_RST
Figure 10: Flatpack Pinout
RADIATION TOLERANCE
Total Dose Radiation Testing
For product procured to guaranteed total dose radiation
levels, each wafer lot will be approved when all sample
devices from each lot pass the total dose radiation test.
The sample devices will be subjected to the total dose
radiation level (Cobalt-60 Source), defined by the ordering
code, and must continue to meet the electrical parameters
specified in the data sheet. Electrical tests, pre and post
irradiation, will be read and recorded.
Dynex Semiconductor can provide radiation testing
compliant with Mil-Std-883 test method 1019, Ionizing
Radiation (Total Dose).
Total Dose (Function to specification)*
1x10⁵ Rad(Si)
Transient Upset (Stored data loss)
5x10¹⁰ Rad(Si)/sec
Transient Upset (Survivability)
>1x10¹² Rad(Si)/sec
Neutron Hardness (Function to specification) >1x10¹⁵ n/cm²
Single Event Upset**
<1x10^-10 Errors/bit day
Latch Up
Not possible
* Other total dose radiation levels available on request
** Worst case galactic cosmic ray upset - interplanetary/high altitude orbit
Table 9: Radiation Hardness Parameters
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