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| 74HC125 Datasheet, PDF (5/9 Pages) NXP Semiconductors – Quad buffer/line driver; 3-state | |||
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Parameter Measurement Information
74HC125
TEST
tPLZ (see Notes D and E)
tPZL(see Notes D and F)
Condition
Vload
Vload
VCC
2.0V to 6.0V
Inputs
VI
tr/tf
VCC
â¤3ns
VM
VCC/2
VLOAD
2 X VCC
CL
15,50 pF
RL
2 Kâ¦
Vâ
10% of VCC
Voltage Waveform
Pulse Duration
Voltage Waveform
Propagation Delay Times
Figure 1 Load Circuit and Voltage Waveforms
Notes:
A. Includes test lead and test apparatus capacitance.
B. All pulses are supplied at pulse repetition rate ⤠1 MHz.
C. The inputs are measured one at a time with one transition per measurement.
D. For the 3 state device tPLZ and tPZL are the same as tPD.
E. tPZL is measured at VM.
D. tPLZ is measured at VOL +Vâ.
74HC125
Document number: DS35326 Rev. 3 - 2
5 of 9
www.diodes.com
January 2013
© Diodes Incorporated
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