CD4148WTP Datasheet, PDF (3/6 Pages) Mospec Semiconductor – Small-Signal Chip Diode

CD4148WTP
Figure 3. Forward Current De-rating
500
400
300
200
100
0
0 20 40 60 80 100 120 140 160 180 200
Tamb-Ambient Temperature/oC
Figure 4. Reverse Voltage De-rating
200
150
100
50
0
0 20 40 60 80 100 120 140 160 180 200
Tamb-Ambient Temperature/oC
TEST CHARACTERISTICS
Test Item
Solderability
Resistance to Soldering Heat
Humidity Steady State
Test Condition
Sn bath at 245±5^oC for 2±0.5s
Sn bath at 260±5^oC for 10±2s
At 85^oC 85%RH for 168hrs
Requirement
>95% area tin covered
V_F,V_R & I_R within spec;
no mechanical damage
V_F,V_R & I_R within spec
Continue Forward Operating Life
Thermal Shock
Bending Strength
At 25^oC I_F =1.1I_F for 1000hrs
-55 ±5^oC/5min to 150±5^oC/5min
for 10cycles
Bending up to 2mm for 1cycle
V_F,V_R & I_R within spec
V_F,V_R & I_R within spec
V_F,V_R & I_R within spec;
no mechanical damage
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