3D3702 Datasheet, PDF (4/4 Pages) Data Delay Devices, Inc. – MONOLITHIC GATED DELAY LINE OSCILLATOR (SERIES 3D3702)

3D3702
SILICON DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25^oC ± 3^oC
Supply Voltage (Vcc): 3.3V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
OUTPUT:
R_load:
C_load:
Threshold:
10KΩ ± 10%
5pf ± 10%
1.5V (Rising & Falling)
Device
Under
Test
10KΩ
470Ω
Digital
Scope
5pf
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
COMPUTER
SYSTEM
PRINTER
PULSE
OUT
GENERATOR
TRIG
O1
EN DEVICE UNDER
TEST (DUT) O2
REF
IN
FREQUENCY/
TIME INTERVAL COUNTER
TRIG
Figure 3: Test Setup
t_FALL
2.4V
EN ^1.5V
0.6V
V_IL
t_ENB
1/f_OSC
O2
1.5V
1.5V
t_RISE
2.4V^VIH
1.5V
0.6V
t_DIS
1.5V
Figure 4: Timing Diagram
Doc #06027
DATA DELAY DEVICES, INC.
4
12/5/2006
Tel: [phone] Fax: [phone] http://www.datadelay.com