DDU39F Datasheet, PDF (3/3 Pages) Data Delay Devices, Inc. – MECHANICALLY VARIABLE TTL DELAY LINE(SERIES DDU39F)

DDU39F
DELAY LINE AUTOMATED TESTING
TEST CONDITIONS
INPUT:
Ambient Temperature: 25^oC ± 3^oC
Supply Voltage (Vcc): 5.0V ± 0.1V
Input Pulse:
High = 3.0V ± 0.1V
Low = 0.0V ± 0.1V
Source Impedance: 50Ω Max.
Rise/Fall Time:
3.0 ns Max. (measured
between 0.6V and 2.4V )
Pulse Width:
100ns
Period:
1000ns
OUTPUT:
Load:
C_load:
Threshold:
1 FAST-TTL Gate
5pf ± 10%
1.5V (Rising & Falling)
NOTE: The above conditions are for test only and do not in any way restrict the operation of the device.
PULSE
GENERATOR
OUT
TRIG
IN DEVICE UNDER OUT
TEST (DUT)
Test Setup
IN
TRIG
OSCILLOSCOPE
T_RISE
PW_IN
PER_IN
T_FALL
INPUT
2.4
V_IH
2.4
SIGNAL
1.5
0.6
1.5
0.6
V_IL
D_RISE
D_FALL
OUTPUT
SIGNAL
V_OH
1.5
1.5
V_OL
Timing Diagram For Testing
Doc #01017
DATA DELAY DEVICES, INC.
3
11/12/01
3 Mt. Prospect Ave. Clifton, NJ 07013