DS1701K Datasheet, PDF (8/9 Pages) Dallas Semiconductor – 1-Wire Thermal Device Evaluation Kit

DS1701K
for easy import into a spreadsheet. The most recent 50 samples are displayed in the window for
observation. Warning—the Log Data function overwrites previous file information. Data previously
stored in the file will be lost unless you change the filename. The sampling interval can be set from 1
second to 15 minutes and can be adjusted from the Sampling Interval menu at the bottom of the window.
MEMORY TAB
The Memory tab allows the user to see all 9 bytes that are read from the DS18B20, DS18S20, and
DS1822. The user also can modify and write the 2 user bytes (TH and TL) and the configuration register.
By left-clicking on the Write button, the scratchpad will be modified with new data, but the EEPROM
values are not updated until the Copy button is pressed. The user can change the TH and TL registers in
one of three formats: in hexadecimal form, in degrees C, or in degrees F. The program will detect which
text box was the last one updated, and write that value to the device.
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