CY23FS08_06 Datasheet, PDF (8/12 Pages) Cypress Semiconductor – Failsafe™ 2.5V/ 3.3V Zero Delay Buffer

CY23FS08
Table 3. Pullability Range from XTAL with Different C0/C1
Ratio
C0/C1 Ratio
200
300
400
Cload(min.)
8.0
8.0
8.0
Cload(max.)
32.0
32.0
32.0
Pullability
Range
–385 333
–256 222
–192 166
Calculated value of the pullability range for the XTAL with
C0/C1 ratio of 200, 300 and 400 are shown in Table 3. For this
calculation Cl(min) = 8pF and Cl(max)= 32pF has been used.
Using a XTAL that has a nominal frequency specified at load
capacitance of 14pF, almost symmetrical pullability range has
been obtained.
Next, it is important to calculate the pullability range including
error tolerances. This would be the capture range of the input
reference frequency that the FailSafe device and XTAL combi-
nation would reliably span.
Calculating the capture range involves subtracting error
tolerances as follows:
Parameter ........................................................ f error (ppm)
Manufacturing frequency tolerance ...................................15
Temperature stability ..........................................................30
Aging ................................................................................... 3
Board/trace variation ........................................................... 5
Total ....................................................................................53
Example: Capture Range for XTAL with C0/C1 Ratio of 200
Negative Capture Range= –385 ppm + 53 ppm = –332 ppm
Positive Capture Range = 333 ppm – 53 ppm = +280 ppm
It is important to note that the XTAL with lower C0/C1 ratio has
wider pullability/capture range as compared to the higher
C0/C1 ratio. This will help the user in selecting the appropriate
XTAL for use in the FailSafe application.
Document #: 38-07518 Rev. *C
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