PALCE22V10 Datasheet, PDF (4/13 Pages) Lattice Semiconductor – 24-Pin EE CMOS (Zero Power) Versatile PAL Device

USE ULTRA37000^TM FOR
ALL NEW DESIGNS
PALCE22V10
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied.............................................–55°C to +125°C
Supply Voltage to Ground Potential
(Pin 24 to Pin 12) ........................................... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High-Z State ............................................... –0.5V to +7.0V
DC Input Voltage............................................ –0.5V to +7.0V
Output Current into Outputs (LOW)............................. 16 mA
DC Programming Voltage............................................. 12.5V
Latch-up Current..................................................... > 200 mA
Static Discharge Voltage
(per MIL-STD-883, Method 3015) ............................ >2001V
Operating Range
Range
Commercial
Industrial
Military^[1]
Ambient
Temperature
0°C to +75°C
–40°C to +85°C
–55°C to +125°C
V_CC
5V ±5%
5V ±10%
5V ±10%
Electrical Characteristics Over the Operating Range^[2]
Parameter
Description
Test Conditions
V_OH
V_OL
V_IH
V_IL[4]
I_IX
I_OZ
I_SC
I_CC1
I_CC2[6]
Output HIGH Voltage
Output LOW Voltage
Input HIGH Level
Input LOW Level
V_CC = Min.,
V_IN = V_IH or V_IL
I_OH = –3.2 mA
I_OH = –2 mA
Com’l
Mil/Ind
V_CC = Min.,
V_IN = V_IH or V_IL
I_OL = 16 mA
I_OL = 12 mA
Com’l
Mil/Ind
Guaranteed Input Logical HIGH Voltage for All Inputs^[3]
Guaranteed Input Logical LOW Voltage for All Inputs^[3]
Input Leakage Current
V_SS < V_IN < V_CC, V_CC = Max.
Output Leakage Current
V_CC = Max., V_SS < V_OUT < V_CC
Output Short Circuit Current V_CC = Max., V_OUT = 0.5V^[5,6]
Standby Power Supply
Current
V_CC = Max.,
V_IN = GND,
Outputs Open in Unprogrammed
Device
10, 15, 25 ns
5, 7.5 ns
15, 25 ns
10 ns
Com’l
Mil/Ind
Operating Power Supply
Current
V_CC = Max., V_IL = 0V, V_IH = 3V, 10, 15, 25 ns
Output Open, Device Programmed
as a 10-bit Counter,
5, 7.5 ns
f = 25 MHz
15, 25 ns
10 ns
Com’l
Com’l
Mil/Ind
Mil/Ind
Min. Max. Unit
2.4
V
0.5 V
2.0
V
–0.5 0.8 V
–10 10 µA
–40 40 µA
–30 –130 mA
90 mA
130 mA
120 mA
120 mA
110 mA
140 mA
130 mA
130 mA
Capacitance^[6]
Parameter
Description
C_IN
C_OUT
Input Capacitance
Output Capacitance
Endurance Characteristics^[6]
Test Conditions
Min.
Max.
Unit
V_IN = 2.0V @ f = 1 MHz
V_OUT = 2.0V @ f = 1 MHz
10
pF
10
pF
Parameter
Description
Test Conditions
Min. Max.
Unit
N
Minimum Reprogramming Cycles
Normal Programming Conditions 100
Cycles
Notes:
1. T_A is the “instant on” case temperature.
2. See the last page of this specification for Group A subgroup testing information.
3. These are absolute values with respect to device ground. All overshoots due to system or tester noise are included.
4. V_IL (Min.) is equal to –3.0V for pulse durations less than 20 ns.
5. Not more than one output should be tested at a time. Duration of the short circuit should not be more than one second. V_OUT = 0.5V has been chosen to avoid test problems
caused by tester ground degradation.
6. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-03027 Rev. *B
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