CY7C1311KV18_12 Datasheet, PDF (30/32 Pages) Cypress Semiconductor – 18-Mbit QDR® II SRAM Four-Word Burst Architecture

Acronyms
Acronym
DDR
FBGA
HSTL
I/O
JTAG
LSB
LMBU
LSBU
MSB
PLL
QDR
SEL
SRAM
TAP
TCK
TMS
TDI
TDO
Description
double data rate
fine-pitch ball grid array
high-speed transceiver logic
input/output
joint test action group
least significant bit
logical multiple bit upset
logical single bit upset
most significant bit
phase locked loop
quad data rate
single event latch up
static random access memory
test access port
test clock
test mode select
test data-in
test data-out
CY7C1311KV18, CY7C1911KV18
CY7C1313KV18, CY7C1315KV18
Document Conventions
Units of Measure
Symbol
°C
k
MHz
µA
µs
mA
mm
ms
ns

pF
V
W
Unit of Measure
degree Celsius
kilohm
megahertz
microampere
microsecond
milliampere
millimeter
millisecond
nanosecond
ohm
picofarad
volt
watt
Document Number: 001-58904 Rev. *E
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