CY7C1012AV25 Datasheet, PDF (3/9 Pages) Cypress Semiconductor – 512K x 24 Static RAM

PRELIMINARY
CY7C1012AV25
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature .................................–65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage on V_CC to Relative GND^[1] .... –0.5V to +3.6V
DC Voltage Applied to Outputs
in High-Z State^[1]....................................–0.5V to V_CC + 0.5V
DC Input Voltage^[1] ................................ –0.5V to V_CC + 0.5V
Current into Outputs (LOW)......................................... 20 mA
Operating Range
Range
Commercial
Industrial
Ambient
Temperature
0°C to +70°C
–40°C to +85°C
V_CC
2.5V ± 0.2V
DC Electrical Characteristics Over the Operating Range
Parameter
Description
V_OH
Output HIGH Voltage
V_OL
Output LOW Voltage
V_IH
Input HIGH Voltage
Test Conditions^[2]
V_CC = Min.,
I_OH = –1.0 mA
V_CC = Min.,
I_OL = 1.0 mA
V_IL[1]
I_IX
I_OZ
I_CC
I_SB1
I_SB2
Input LOW Voltage
Input Load Current
GND < V_I < V_CC
Output Leakage Current GND < V_OUT < V_CC, Output Disabled
V_CC Operating
Supply Current
V_CC = Max.,
Commercial
f = f_MAX = 1/t_{RC Industrial}
Automatic CE
Power-down Current
—TTL Inputs
Automatic CE
Power-down Current
—CMOS Inputs
Max. V_CC, CE > V_IH
V_IN > V_IH or
V_IN < V_IL, f = f_MAX
Max. V_CC,
Commercial
CE > V_CC – 0.2V, /Industrial
V_IN > V_CC – 0.2V,
or V_IN < 0.2V, f = 0
-8
Min. Max.
2.0
0.4
2.0 V_CC
+ 0.3
–0.3 0.8
–1 +1
–1 +1
300
300
100
50
-10
Min. Max.
2.0
0.4
2.0 V_CC
+ 0.3
–0.3 0.8
–1 +1
–1 +1
275
275
100
50
-12
Min. Max.
2.0
0.4
2.0 V_CC
+ 0.3
–0.3 0.8
–1 +1
–1 +1
260
260
100
50
Unit
V
V
V
V
µA
µA
mA
mA
mA
mA
Capacitance^[3]
Parameter
Description
Test Conditions
Max.
C_IN
Input Capacitance
T_A = 25°C, f = 1 MHz, V_CC = 2.5V
8
C_OUT
I/O Capacitance
10
Notes:
1. V_IL (min.) = –2.0V for pulse durations of less than 20 ns.
2. CE refers to a combination of CE₀, CE₁, and CE₂. CE is active LOW when all three of these signals are active LOW at the same time.
3. Tested initially and after any design or process changes that may affect these parameters.
Unit
pF
pF
Document #: 38-05337 Rev. **
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