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CY7C1371DV33 Datasheet, PDF (20/29 Pages) Cypress Semiconductor – 18-Mbit (512 K x 36) Flow-Through SRAM with NoBL™ Architecture
Switching Characteristics
Over the Operating Range
Parameter [17, 18]
Description
tPOWER[19]
Clock
tCYC
tCH
tCL
Output Times
tCDV
tDOH
tCLZ
tCHZ
tOEV
tOELZ
tOEHZ
Setup Times
tAS
tALS
tWES
tCENS
tDS
tCES
Hold Times
tAH
tALH
tWEH
tCENH
tDH
tCEH
Clock cycle time
Clock HIGH
Clock LOW
Data output valid after CLK rise
Data output hold after CLK rise
Clock to low Z [20, 21, 22]
Clock to high Z [20, 21, 22]
OE LOW to output valid
OE LOW to output low Z [20, 21, 22]
OE HIGH to output high Z [20, 21, 22]
Address setup before CLK rise
ADV/LD setup before CLK rise
WE, BWX setup before CLK rise
CEN setup before CLK rise
Data input setup before CLK rise
Chip enable setup before CLK rise
Address hold after CLK rise
ADV/LD hold after CLK rise
WE, BWX hold after CLK rise
CEN hold after CLK rise
Data input hold after CLK rise
Chip enable hold after CLK rise
CY7C1371DV33
133 MHz
Unit
Min
Max
1
–
ms
7.5
–
ns
2.1
–
ns
2.1
–
ns
–
6.5
ns
2.0
–
ns
2.0
–
ns
–
4.0
ns
–
3.2
ns
0
–
ns
–
4.0
ns
1.5
–
ns
1.5
–
ns
1.5
–
ns
1.5
–
ns
1.5
–
ns
1.5
–
ns
0.5
–
ns
0.5
–
ns
0.5
–
ns
0.5
–
ns
0.5
–
ns
0.5
–
ns
Notes
17. Timing reference level is 1.5 V when VDDQ = 3.3 V and is 1.25 V when VDDQ = 2.5 V.
18. Test conditions shown in (a) of Figure 4 on page 19 unless otherwise noted.
19.
This part has
be initiated.
a
voltage
regulator
internally;
tPOWER
is
the
time
that
the
power
needs
to
be
supplied
above
VDD(minimum)
initially,
before
a
read
or
write
operation
can
20. tCHZ, tCLZ, tOELZ, and tOEHZ are specified with AC test conditions shown in part (b) of Figure 4 on page 19. Transition is measured ±200 mV from steady-state voltage.
21.
At any
These
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icsolnetsesnttihoannctoOnEdLiZtioann,dbtuCtHreZfilseclet spsartahmanetteCrLsZgtuoaerlaimntieneadteobvuesr
contention
worst case
between SRAMs when
user conditions. Device
sharing the
is designed
same data bus.
to achieve high Z
prior to low Z under the same system conditions.
22. This parameter is sampled and not 100% tested.
Document Number: 001-75433 Rev. *A
Page 20 of 29