CY7C185_06 Datasheet, PDF (2/12 Pages) Cypress Semiconductor – 8K x 8 Static RAM

CY7C185
Maximum Ratings
(Above which the useful life may be impaired. For user guide-
lines, not tested.)
Storage Temperature ................................. –65°C to +150°C
Ambient Temperature with
Power Applied............................................. –55°C to +125°C
Supply Voltage to Ground Potential ............... –0.5V to +7.0V
DC Voltage Applied to Outputs
in High Z State^[2] ............................................ –0.5V to +7.0V
DC Input Voltage^[2]......................................... –0.5V to +7.0V
Output Current into Outputs (LOW)............................. 20 mA
Static Discharge Voltage........................................... >2001V
(per MIL-STD-883, Method 3015)
Latch-Up Current .................................................... >200 mA
Operating Range
Range
Commercial
Industrial
Ambient
Temperature
0°C to +70°C
–40°C to +85°C
V_CC
5V ± 10%
5V ± 10%
Electrical Characteristics Over the Operating Range
Parameter Description Test Conditions
V_OH
Output HIGH V_CC = Min.,
Voltage
I_OH = –4.0 mA
V_OL
Output LOW V_CC = Min.,
Voltage
I_OL = 8.0 mA
V_IH
Input HIGH
Voltage
V_IL
Input LOW
Voltage^[2]
I_IX
Input Leakage GND ≤ V_I ≤ V_CC
Current
I_OZ
Output Leakage GND ≤ V_I ≤ V_CC,
Current
Output Disabled
I_CC
V_CC Operating V_CC = Max.,
Supply Current I_OUT = 0 mA
I_SB1
Automatic
Max. V_CC,
Power-Down CE₁ ≥ V_IH or CE₂ ≤ V_IL
Current
Min. Duty Cycle =100%
I_SB2
Automatic
Max. V_CC,
Power-Down CE₁ ≥ V_CC – 0.3V,
Current
or CE₂ ≤ 0.3V
V_IN ≥ V_CC – 0.3V or
V_IN ≤ 0.3V
Capacitance^[3]
–15
Min.
Max.
2.4
0.4
2.2 V_CC + 0.3V
–0.5
0.8
–5
+5
–5
+5
130
40
15
–20
Min.
Max.
2.4
–25, -35
Min.
Max. Unit
2.4
V
0.4
0.4
V
2.2 V_CC + 0.3V 2.2 V_CC + 0.3V V
–0.5
0.8
–0.5
0.8
V
–5
+5
–5
+5
µA
–5
+5
–5
+5
µA
110
100 mA
20
20
mA
15
15
mA
Parameter
C_IN
C_OUT
Description
Input Capacitance
Output Capacitance
Test Conditions
T_A = 25°C, f = 1 MHz,
V_CC = 5.0V
Max.
Unit
7
pF
7
pF
Notes:
2. Minimum voltage is equal to –3.0V for pulse durations less than 30 ns.
3. Tested initially and after any design or process changes that may affect these parameters.
Document #: 38-05043 Rev. *B
Page 2 of 12
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