WM8234 Datasheet, PDF (48/144 Pages) Wolfson Microelectronics plc – 70MSPS 6-Channel AFE with Sensor Timing Generation and LVDS/CMOS Data Output

WM8234
TEST PATTERN GENERATOR
WM8234 has test pattern generator which can be used for interface verification between AFE data
output and back-end devices without sensor signal input. This function can be presented in several
different patterns by PGPAT[1:0] and PGMARCH registers as shown below. The PGLEVEL,
PGWIDTH1 and PGWIDTH2 are the parameter to define the pattern level and width. The PGLEVEL
register has 16bit length, PGWIDTH1 and PGWIDTH2 has 8bit length.
Note that test pattern generator is required TGSYNC input. (i.e. this can be used under TG slave
mode operation only.)
d=PGLEVEL
A=PGWIDTH1
B=PGWIDTH2
PGEN (register)
TGSYNC (input)
PGPAT=00
(Fixed Pattern)
0
PGPAT=01
(Vertical RAMP)
0
PGPAT=10
(Horizontal RAMP)
0
PGPAT=11
(Patch)
0
d
0
A
md
d
A
0
B
d
BA
A
d
A
0
B
0
nd
2d
0
Return to 0 at 65535
65535
0
0
d
d
0
0
0
A
Figure 32 Test Pattern Output Data Formats
d=PGLEVEL
A=PGWIDTH1
B=PGWIDTH2
PGPAT=01
(Vertical RAMP)
TGSYNC
PGINV=0
A
0
A
d
A
2d
A
3d
A
4d
A
5d
A
6d
PGINV=1
A
~0
A
~d
A
~2d
A
~3d
A
~4d
A
~5d
A
~6d
Figure 33 Test Pattern Output image
PGPAT=10
(Horizontal RAMP)
TGSYNC
PGPAT=11
(Patch)
TGSYNC
A
A
A
A
A
A
A
AAAAAAAA
0 d 2d 3d 4d 5d 6d 7d
AA
A
A
d
A
d
A
d
A
d
A
d
d
d
BA
0
B
d
d
d
A
0
B
d
d
d
A
B
BABA
d
AAAAAAAA
~0 ~d ~2d ~3d ~4d ~5d ~6d ~7d
BA
~0
~d
~d
~d
~0
~d
~d
~d
48
Rev 4.6