CAT5261 Datasheet, PDF (7/15 Pages) Catalyst Semiconductor – Dual Digitally Programmable Potentiometer

CAT5261
WRITE CYCLE LIMITS
Over recommended operating conditions unless otherwise stated.
Symbol Parameter
tWR
Write Cycle Time
Min
Typ Max Units
5
ms
RELIABILITY CHARACTERISTICS
Over recommended operating conditions unless otherwise stated.
Symbol Parameter
Reference Test Method
Min
Typ
N_END(1) Endurance
MIL-STD-883, Test Method 1033 1,000,000
T_DR(1)
Data Retention
MIL-STD-883, Test Method 1008
100
V_ZAP(1) ESD Susceptibility MIL-STD-883, Test Method 3015
2000
I_LTH(1)
Latch-Up
JEDEC Standard 17
100
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
Max Units
Cycles/Byte
Years
Volts
mA
Figure 1. Sychronous Data Timing
V_IH
CS
V_IL
V_IH
SCK
V_IL
V_IH
SI
VIL
t_CSS
t_WH
t_SU
t_H
VALID IN
V_OH
SO
V_OL
HI-Z
Note: Dashed Line= mode (1, 1)
Figure 2. HOLD Timing
CS
SCK
HOLD
SO
tCD
tHD
tHZ
t_CS
t_CSH
t_WL
t_RI
tFI
t_V
t_HO
t_DIS
HI-Z
tCD
tHD
HIGH IMPEDANCE
tLZ
7
Document No. 2122, Rev. B