CAT5132 Datasheet, PDF (5/13 Pages) Catalyst Semiconductor – 15 Volt Digitally Programmable Potentiometer (DPP) with 128 Taps and 2-wire Interface

CAT5132
POWER UP TIMING ⁽¹⁾⁽²⁾
Symbol
Parameter
t_PUR Power-up to Read Operation
t_PUW Power-up to Write Operation
Min
Max
Units
1
ms
1
ms
XDCP TIMING
Symbol
Parameter
Min
t_WRPO Wiper Response Time After Power Supply Stable
5
t_WRL Wiper Response Time After Instruction Issued
5
Max
Units
10
µs
10
µs
WRITE CYCLE LIMITS
Symbol
Parameter
t_WR Write Cycle Time (see Fig. 2)
Min
Max
Units
5
ms
The write cycle is the time from a valid stop condition of a write sequence to the end of the internal program/erase cycle.
During the write cycle, the bus interface circuits are disabled, SDA is allowed to remain high and the device does not
respond to its slave address.
RELIABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Max
N (1)
END
Endurance
MIL-STD-883, Test Method 1033 100,000
T (1)
DR
Data Retention
MIL-STD-883, Test Method 1008
100
V (1)
ZAP
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
I ⁽¹⁾
LTH
Latch-Up
JEDEC Standard 17
100
Notes:
1. This parameter is tested initially and after a design or process change that affects the parameter.
2. t_PUR and t_PUW are the delays required from the time VCC is stable until the specified operation can be initiated.
Units
Cycles/Byte
Years
Volts
mA
TYPICAL PERFORMANCE CHARACTERISTICS
12.000
10.000
8.000
6.000
4.000
2.000
0.000
0
Resistance between R_W and R_L
Vcc=2.7V; V+=8v
Vcc=5.5V; V+=15V
16
32
48
64
80
96
112 128
Tap position
Icc2 (NV write) vs Temperature
400
350
300
250
200
150
Vcc = 2.7V
100
Vcc = 5.5V
50
0
-50 -30 -10
10 30 50 70
Temperature (°C)
90 110 130
© 2005 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice
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Doc No. 25092, Rev. 00