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CAT28F001_05 Datasheet, PDF (5/18 Pages) Catalyst Semiconductor – 1 Megabit CMOS Boot Block Flash Memory
CAT28F001
SUPPLY CHARACTERISTICS
Symbol
VLKO
VCC
VPPL
VPPH
VHH
Parameter
VCC Erase/Write Lock Voltage
VCC Supply Voltage
VPP During Read Operations
VPP During Erase/Program
RP, OE Unlock Voltage
Limits
Min
Max.
Unit
2.5
V
4.5
5.5
V
0
6.5
V
11.4
12.6
V
11.4
12.6
V
A.C. CHARACTERISTICS, Read Operation
VCC = +5V ±10%, unless otherwise specified
JEDEC Standard
Symbol Symbol Parameter
28F001-90(7)
Min Max
28F001-12(7)
Min Max
Units
tAVAV
tRC
tELQV
tCE
Read Cycle Time
CE Access Time
90
120
ns
90
120 ns
tAVQV
tGLQV
tACC
tOE
Address Access Time
OE Access Time
90
120 ns
35
50
ns
-
tOH
Output Hold from Address OE/CE Change 0
0
ns
tGLQX
tOLZ(1)(6) OE to Output in Low-Z
0
0
ns
tELQX
tLZ(1)(6)
CE to Output in Low-Z
0
0
ns
tGHQZ
tDF(1)(2)
OE High to Output High-Z
30
30
ns
tEHQZ
tHZ(1)(2)
CE High to Output High-Z
35
55
ns
tPHQV
tPWH
RP High to Output Delay
600
600 ns
Figure 1. A.C. Testing Input/Output Waveform(3)(4)(5) Figure 2. Highspeed A.C. Testing Input/Output
Waveform(3)(4)(5)
VCC - 0.3V
0.0 V
INPUT PULSE LEVELS
2.0 V
0.8 V
REFERENCE POINTS
3.0 V
0.0 V
INPUT PULSE LEVELS
1.5 V
REFERENCE POINTS
Testing Load Circuit (example)
1.3V
Testing Load Circuit (example)
1.3V
1N914
1N914
DEVICE
UNDER
TEST
3.3K
OUT
CL = 100 pF
CL INCLUDES JIG CAPACITANCE
DEVICE
UNDER
TEST
3.3K
CL = 30 pF
OUT
CL INCLUDES JIG CAPACITANCE
Note:
(1) This parameter is tested initially and after a design or process change that affects the parameter.
(2) Output floating (High-Z) is defined as the state where the external data line is no longer driven by the output buffer.
(3) Input Rise and Fall Times (10% to 90%) < 10 ns.
(4) Input Pulse Levels = 0.45V and 2.4V. For High Speed Input Pulse Levels 0.0V and 3.0V.
(5) Input and Output Timing Reference = 0.8V and 2.0V. For High Speed Input and Output Timing Reference = 1.5V.
(6) Low-Z is defined as the state where the external data may be driven by the output buffer but may not be valid.
(7) For load and reference points, see Fig. 1
5
Doc. No. 1078, Rev. I