CAT35C704 Datasheet, PDF (2/14 Pages) Catalyst Semiconductor – 4K-Bit Secure Access Serial E2PROM

CAT35C704
Preliminary
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias ................. –55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground⁽¹⁾ ........... –2.0V to +V_CC + 2.0V
V_CC with Respect to Ground ............... –2.0V to +7.0V
Package Power Dissipation
Capability (T_a = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current⁽²⁾ ........................ 100mA
*COMMENT
Stresses above those listed under “Absolute Maximum
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for
extended periods may affect device performance and
reliability.
RELIABILITY CHARACTERISTICS
Symbol
Parameter
N_END(3)
T_DR(3)
V_ZAP(3)
I_LTH(3)(4)
Endurance
Data Retention
ESD Susceptability
Latch-up
Min.
100,000
100
2000
100
Max.
Units
Cycles/Byte
Years
Volts
mA
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
D.C. CHARACTERISTICS
VCC = +5V ±10%,unless otherwise specified.
Symbol
I_CC
I_SB
V_IL
V_IH
V_OL
V_OH
I_LI(5)
I_LO
Parameter
Power Supply Current
(Operating)
Power Supply Current
(Standby)
Input Low Voltage
Input High Voltage
Output Low Voltage
Output High Voltage
Input Leakage Current
Output Leakage Current
Min.
–0.1
2
2.4
Limits
Typ.
Max.
3
250
0.8
0.4
2
10
Units
mA
µA
V
V
V
V
µA
µA
Test Conditions
V_CC = 5.5V, CS = V_CC
DO is Unloaded.
V_CC = 5.5V, CS = 0V
DI = 0V, CLK = 0V
I_OL = 2.1mA
I_OH = –400µA
V_IN = 5.5V
V_OUT = 5.5V, CS = 0V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5V, which may overshoot to V_CC + 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V_CC +1V.
(5) PE pin test conditions: V_IH < V_IN < V_IL
Doc. No. 25045-00 2/98
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