CAT24WC129_04 Datasheet, PDF (2/9 Pages) Catalyst Semiconductor – 128K-Bit I2C Serial CMOS EEPROM

CAT24WC129
ABSOLUTE MAXIMUM RATINGS*
*COMMENT
Temperature Under Bias
–55°C to +125°C Stresses above those listed under “Absolute Maximum
Storage Temperature ....................... –65°C to +150°C
Ratings” may cause permanent damage to the device.
These are stress ratings only, and functional operation of
Voltage on Any Pin with
Respect to Ground⁽¹⁾ ........... –2.0V to +V_CC + 2.0V
the device at these or any other conditions outside of those
listed in the operational sections of this specification is not
V_CC with Respect to Ground ............... –2.0V to +7.0V ^{implied. Exposure to any absolute maximum rating for}
extended periods may affect device performance and
Package Power Dissipation
reliability.
Capability (Ta = 25°C) ................................... 1.0W
Lead Soldering Temperature (10 secs) ............ 300°C
Output Short Circuit Current⁽²⁾ ........................ 100mA
t _{RELIABILITY CHARACTERISTICS}
r _Symbol
N_END(3)
a _TDR(3)
P ^VZAP(3)
I_LTH(3)(4)
Parameter
Endurance
Data Retention
ESD Susceptibility
Latch-up
Min.
100,000
100
2000
100
Max.
D.C. OPERATING CHARACTERISTICS
d _{VCC = +1.8V to +6.0V, unless otherwise specified.}
Units
Cycles/Byte
Years
Volts
mA
Reference Test Method
MIL-STD-883, Test Method 1033
MIL-STD-883, Test Method 1008
MIL-STD-883, Test Method 3015
JEDEC Standard 17
e _{Symbol Parameter}
u _{ICC1 Power Supply Current - Read}
Limits
Min. Typ.
Max.
1
Units
mA
tin ^{ICC2 Power Supply Current - Write}
3
mA
I_SB(5) Standby Current
1
µA
n _ILI
o _ILO
c ^VIL
V_IH
is ^VOL1
D ^VOL2
Input Leakage Current
Output Leakage Current
Input Low Voltage
–1
Input High Voltage
V_CC x 0.7
Output Low Voltage (V_CC = +3.0V)
Output Low Voltage (V_CC = +1.8V)
3
µA
3
µA
V_CC x 0.3 V
V_CC + 0.5 V
0.4
V
0.5
V
Test Conditions
f_SCL = 100 KHz
V_CC=5V
f_SCL = 100 KHz
V_CC=5V
V_IN = GND or V_CC
V_CC=5V
V_IN = GND to V_CC
V_OUT = GND to V_CC
I_OL = 3.0 mA
I_OL = 1.5 mA
CAPACITANCE T_A = 25°C, f = 1.0 MHz, V_CC = 5V
Symbol
Test
Max.
Units
Conditions
C_I/O(3) Input/Output Capacitance (SDA)
8
pF
V_I/O = 0V
C_IN(3)
Input Capacitance (SCL, WP)
6
pF
V_IN = 0V
Note:
(1) The minimum DC input voltage is –0.5V. During transitions, inputs may undershoot to –2.0V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC +0.5V, which may overshoot to V_CC + 2.0V for periods of less than 20ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) This parameter is tested initially and after a design or process change that affects the parameter.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1V to V_CC +1V.
(5) Maximum standby current (I_SB ) = 10µA for the Automotive and Extended Automotive temperature range.
Doc. No. 1079, Rev. V
2