CAT24FC17 Datasheet, PDF (2/10 Pages) Catalyst Semiconductor – 16-kb I2C Serial EEPROM

CAT24FC17
ABSOLUTE MAXIMUM RATINGS*
Temperature Under Bias
–55°C to +125°C
Storage Temperature ....................... –65°C to +150°C
Voltage on Any Pin with
Respect to Ground⁽¹⁾ ............ –2.0 V to VCC + 2.0 V
V_CC with Respect to Ground ............. –2.0 V to +7.0 V
Package Power Dissipation
Capability (TA = 25°C) .................................. 1.0 W
RELIABILITY CHARACTERISTICS⁽³⁾
Symbol
Parameter
N_END
Endurance
T_DR
Data Retention
V_ZAP
I_LTH(4)
ESD Susceptibility
Latch-up
Lead Soldering Temperature (10 seconds) ...... 300°C
Output Short Circuit Current⁽²⁾ ....................... 100 mA
*COMMENT
Stresses above those listed under “Absolute Maximum Ratings” may
cause permanent damage to the device. These are stress ratings only,
and functional operation of the device at these or any other conditions
outside of those listed in the operational sections of this specification is not
implied. Exposure to any absolute maximum rating for extended periods
may affect device performance and reliability.
Min
Typ
1,000,000
100
4000
100
Max Units
Cycles/Byte
Years
Volts
mA
D.C. OPERATING CHARACTERISTICS
V_CC = 2.5 V to 5.5 V, unless otherwise specified.
Symbol
Parameter
Test Conditions
Min
Typ
Max
Units
ICC
Power Supply Current (Read)
fSCL = 400 kHz
1
mA
ICC
ISB(5)
Power Supply Current (Write)
Standby Current (VCC = 5.0 V)
fSCL = 400 kHz
VIN = GND or VCC
3
mA
1
µA
I_LI
Input Leakage Current
V_IN = GND to V_CC
1
µA
I_LO
Output Leakage Current
V_OUT = GND to V_CC
1
µA
V_IL
Input Low Voltage
–1
V_CC x 0.3
V
V_IH
Input High Voltage
V_CC x 0.7
V_CC + 1.0 V
VOL Output Low Voltage (VCC = 3.0 V)
IOL = 3 mA
0.4
V
CAPACITANCE T_A = 25°C, f = 400 kHz, V_CC = 5 V
Symbol
Test
Conditions
CI/O(3)
Input/Output Capacitance (SDA)
VI/O = 0 V
CIN(3)
Input Capacitance (other pins)
VIN = 0 V
Min
Typ
Max Units
8
pF
6
pF
Note:
(1) The minimum DC input voltage is –0.5 V. During transitions, inputs may undershoot to –2.0 V for periods of less than 20 ns. Maximum DC
voltage on output pins is V_CC + 0.5 V, which may overshoot to V_CC + 2.0 V for periods of less than 20 ns.
(2) Output shorted for no more than one second. No more than one output shorted at a time.
(3) These parameters are tested initially and after a design or process change that affects the parameter according tp appropriate AEC-Q100
and JEDEC test methods.
(4) Latch-up protection is provided for stresses up to 100 mA on address and data pins from –1.0 V to V_CC + 1.0 V.
(5) Maximum standby current (I_SB) = 10µA for the Extended Automotive temperature range.
Doc. No. 1077, Rev. F
2
© 2005 by Catalyst Semiconductor, Inc.
Characteristics subject to change without notice