CM1233 Datasheet, PDF (7/10 Pages) California Micro Devices Corp – PicoGuard XSTM eXtreme Speed ESD Clamp Array For High Speed Data Line Protection

CM1233
IEC 6100-4-2
Test Standards
Standard
ESD Device
Standard ESD
Device Test Setup
Voltage
Probe
Device Under
Protection (DUP)
RVARIABLE
IEC 6100-4-2
Test Standards
CM1233
Current
Probe
IRESIDUAL
CM1233 Test Setup
Voltage
Probe
Device Under
Protection (DUP)
RVARIABLE
Current
Probe
IRESIDUAL
Figure 6. Test Setups: Standard Device (Left) and CM1233 (Right)
100.0Ω
Time (100.0ps /div)
Figure 7. Typical Channel TDR Measured Across Out_x and In_x Per Each Differential Channels Pair
(Typical 200ps Incident Rise Time)
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490 N. McCarthy Blvd., Milpitas, CA 95035-5112 ● Tel: [phone] ● Fax: [phone] ● www.cmd.com
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Issue A – 03/18/08