DAC8822_07 Datasheet, PDF (2/24 Pages) Burr-Brown (TI) – 16-Bit, Dual, Parallel Input, Multiplying Digital-to-Analog Converter

DAC8822
SBAS390A – DECEMBER 2006 – REVISED MARCH 2007
www.ti.com
This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with
appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be
more susceptible to damage because very small parametric changes could cause the device not to meet its published
specifications.
ORDERING INFORMATION⁽¹⁾
PRODUCT
DAC8822QB
DAC8822QC
RELATIVE
ACCURACY
(LSB)
±2
±1
DIFFERENTIAL
NONLINEARITY
(LSB)
±1
±1
PACKAGE-LEAD
(DESIGNATOR)
TSSOP-38
(DBT)
TSSOP-38
(DBT)
SPECIFIED
TEMPERATURE
RANGE
–40°C to +125°C
–40°C to +125°C
PACKAGE
MARKING
DAC8822
DAC8822
(1) For the most current package and ordering information see the Package Option Addendum at the end of this document, or see the TI
web site at www.ti.com.
ABSOLUTE MAXIMUM RATINGS
over operating free-air temperature range (unless otherwise noted)⁽¹⁾
V_DD to GND
Digital input voltage to GND
V (I_OUT) to GND
REF, R_OFS, R_FB, R₁, R_COM to AGND, DGND
Operating temperature range
Storage temperature range
Junction temperature range (T_J max)
Power dissipation
Thermal impedance, R_θJA
ESD rating
Human Body Model (HBM)
Charged Device Model (CDM)
DAC8822
–0.3 to +7
–0.3 to +V_DD + 0.3
–0.3 to +V_DD + 0.3
±25
–40 to +125
–65 to +150
+150
(T_J max – T_A) / R_θJA
53
4000
500
UNIT
V
V
V
V
°C
°C
°C
W
°C/W
V
V
(1) Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. Exposure to absolute
maximum conditions for extended periods may affect device reliability.
2
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