HCPL-5531 Datasheet, PDF (9/13 Pages) AVAGO TECHNOLOGIES LIMITED – Hermetically Sealed, Transistor Output Optocouplers for Analog and Digital Applications

Typical Characteristics
All typical values are at T_A = 25°C, V_CC = 5 V, unless otherwise specified.
Parameter
Input Capacitance
Input Diode Temperature
Coefficient
Resistance (Input-Output)
Capacitance (Input-Output)
Transistor DC Current Gain
Small Signal Current Transfer Ratio
Common Mode Transient Immunity
at Logic High Level Output
Symbol
C_IN
V_F/T_A
R_I-O
C_I-O
h_FE
I_O/I_F
|CM_H|
Common Mode Transient Immunity |CM_L|
at Logic Low Level Output
Bandwidth
BW
Test Conditions
V_F = 0 V, f = 1 MHz
I_F = 20 mA
V_I-O = 500 V
f = 1 MHz
V_O = 5 V, I_O = 3 mA
V_CC = 5 V, V_O = 2 V
I_F = 0 mA, R_L = 8.2 k,
V_O (min) = 2.0 V,
V_CM = 10 V_P-P
I_F = 16 mA, R_L = 8.2 k,
V_O (max) = 0.8 V,
V_CM = 10 V_P-P
Typ.
60
-1.5
10¹²
1.0
250
21
1000
-1000
9
Units Fig.
pF
mV/°C

pF
-
%
7
V/s
10
V/s
10
MHz
8
Notes
1
1
3
1, 11
1
1
1, 7
1, 7
8
Multi-Channel Product Only
Parameter
Input-Input Insulation Leakage
Current
Resistance (Input-Input)
Capacitance (Input-Input)
Symbol
I_I-I
R_I-I
C_I-I
Test Conditions
RH ≤ 65%, V_I-I = 500 V, t = 5 s
V_I-I = 500 V
f=1 MHz
Typ.
Units Notes
1
pA
5, 9
10¹²

5
0.8
pF
5
Notes:
1. Each channel of a multi-channel device.
2. Current Transfer Ratio is defined as the ratio of output collector current, I_O, to the forward LED input current, I_F, times 100%. CTR is known to
degrade slightly over the unit’s lifetime as a function of input current, temperature, signal duty cycle, and system on time. Refer to Application
Note 1002 for more detail. ln short, it is recommended that designers allow at least 20-25% guardband for CTR degradation.
3. All devices are considered two-terminal devices; measured between all input leads or terminals shorted together and all output leads or terminals
shorted together.
4. The 4N55, 4N55/883B, HCPL-257K, HCPL-6530, HCPL-6531, and HCPL-653K dual channel parts function as two independent single channel units.
Use the single channel parameter limits. I_F = 0 mA for channel under test and I_F = 20 mA for other channels.
5. Measured between adjacent input pairs shorted together for each multichannel device.
6. t_PHL propagation delay is measured from the 50% point on the leading edge of the input pulse to the 1.5 V point on the leading edge of the
output pulse. The t_PLH propagation delay is measured from the 50% point on the trailing edge of the input pulse to the 1.5 V point on the trail-
ing edge of the output pulse.
7. CM_L is the maximum rate of rise of the common mode voltage that can be sustained with the output voltage in the logic low state (V_O < 0.8 V).
CM_H is the maximum rate of fall of the common mode voltage that can be sustained with the output voltage in the logic high state (V_O > 2.0
V).
8. Bandwidth is the frequency at which the ac output voltage is 3 dB below the low frequency asymptote. For the HCPL-5530 the typical bandwidth
is 2 MHz.
9. This is a momentary withstand test, not an operating condition.
10. Higher CTR minimums are available to support special applications.
11. Measured between each input pair shorted together and all output connections for that channel shorted together.
12. Standard parts receive 100% testing at 25°C (Subgroups 1 and 9). SMD and 883B parts receive 100% testing at 25, 125, and -55°C (Subgroups 1
and 9, 2 and 10, 3 and 11, respectively).
13. Not required for 4N55, 4N55/883B, HCPL-257K, 5962-8767901, and 5962-8767905 types.
14. Required for 4N55, 4N55/883B, HCPL-257K, 5962-8767901, and 5962-8767905 types only.
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