HCPL-8100 Datasheet, PDF (8/10 Pages) Agilent(Hewlett-Packard) – High Current Line Driver

Test Circuit Diagrams
Unless otherwise noted, all test circuits are at T_A = 25°C, V_CC = 5 V, sinusoidal waveform input, and signal frequency f =
132 kHz.
20 kΩ
SCOPE
5V
V IN = 1.25 VPP
100 nF 10 kΩ
R ref
1 _Status
Tx -out ⁸
2 _{Tx -en}
7
V CC
3
Tx -in
6
GND
4
R ref
5
GND
HCPL-8100/0810
1 µF
5V
100 µF
100 nF
RL
2.5 Ω
Figure 13. Load detection test circuit.
20 kΩ
5V
100 nF
V IN = 1 VPP
10 kΩ
f = 10 k ~ 10 MHz
R ref
24 kΩ
1 _Status
Tx -out ⁸
2 _{Tx -en}
7
V CC
3 _{Tx -in}
GND ⁶
4
R ref
5
GND
HCPL-8100/0810
Figure 14. Gain bandwidth product test circuit.
20 kΩ
V OUT
1 µF
5V
RL
50 Ω
100 µF
100 nF
V IN = 1.75 VPP
100 nF 10 kΩ
PULSE GEN.
V PULSE = 5 V,
fPULSE ≤ 1 kHz
R ref
24 kΩ
1
8
St atus Tx -out
2
Tx -en
7
V CC
3
Tx -in
6
GND
4
R ref
5
GND
HCPL-8100/0810
Figure 15. Tx enable/disable time test circuit.
V OUT
5V
100 µF
100 nF
20 kΩ
5V
V IN = 1.75 VPP
100 nF 10 kΩ
R ref
24 kΩ
1
Status
8
Tx -out
2
T x-en
3
Tx -in
7
V CC
6
GND
4
R ref
5
GND
HCPL - 8100/0810
1 µF
50 Ω
SPECTRUM
5 V ^ANALYZER
100 µF
100 nF
Figure 16. Tx-out harmonic distortion test circuit.