ATMEGA3250V_14 Datasheet, PDF (75/362 Pages) ATMEL Corporation – High Endurance Non-volatile Memory Segments

ATmega325/3250/645/6450
• TDO, ADC6 – Port F, Bit 6
ADC6, Analog to Digital Converter, Channel 6.
TDO, JTAG Test Data Out: Serial output data from Instruction Register or Data Register. When
the JTAG interface is enabled, this pin can not be used as an I/O pin. In TAP states that shift out
data, the TDO pin drives actively. In other states the pin is pulled high.
• TMS, ADC5 – Port F, Bit 5
ADC5, Analog to Digital Converter, Channel 5.
TMS, JTAG Test mode Select: This pin is used for navigating through the TAP-controller state
machine. When the JTAG interface is enabled, this pin can not be used as an I/O pin.
• TCK, ADC4 – Port F, Bit 4
ADC4, Analog to Digital Converter, Channel 4.
TCK, JTAG Test Clock: JTAG operation is synchronous to TCK. When the JTAG interface is
enabled, this pin can not be used as an I/O pin.
• ADC3 - ADC0 – Port F, Bit 3:0
Analog to Digital Converter, Channel 3-0.
Table 14-12. Overriding Signals for Alternate Functions in PF7:PF4
Signal
Name
PF7/ADC7/TDI PF6/ADC6/TDO PF5/ADC5/TMS PF4/ADC4/TCK
PUOE
JTAGEN
JTAGEN
JTAGEN
JTAGEN
PUOV
1
1
1
1
DDOE
JTAGEN
JTAGEN
JTAGEN
JTAGEN
DDOV
0
SHIFT_IR +
0
0
SHIFT_DR
PVOE
0
JTAGEN
0
0
PVOV
0
TDO
0
0
PTOE
–
–
–
–
DIEOE
JTAGEN
JTAGEN
JTAGEN
JTAGEN
DIEOV
0
0
0
0
DI
–
–
–
–
AIO
TDI
ADC6 INPUT
TMS
TCK
ADC7 INPUT
ADC5 INPUT
ADC4 INPUT
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