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AT49SN12804 Datasheet, PDF (28/41 Pages) ATMEL Corporation – 128-megabit (8M x 16) Burst/Page Mode 1.8-volt Flash Memory
AC Asynchronous Read Timing Characteristics
Symbol
Parameter
Min
Max
Units
tACC1
Access, AVD To Data Valid
70
ns
tACC2
Access, Address to Data Valid
70
ns
tCE
Access, CE to Data Valid
70
ns
tOE
OE to Data Valid
20
ns
tAHAV
Address Hold from AVD
9
ns
tAVLP
AVD Low Pulse Width
10
ns
tAVHP
AVD High Pulse Width
10
ns
tAAV
Address Valid to AVD
7
ns
tDF
CE, OE High to Data Float
25
ns
tOH
Output Hold from OE, CE or Address, Whichever Occurred First
ns
tRO
RESET to Output Delay
150
ns
AVD Pulsed Asynchronous Read Cycle Waveform(1)(2)
tCE
CE
I/O0-I/O15
tACC2
tDF
DATA VALID
tDF
A2 -A22
tAAV
tAHAV
tACC2
A0 -A1
tAAV
tAHAV
(1)
AVD
tAVHP
tAVLP
tACC1
OE
tOE
tRO
RESET
Notes: 1. After the high-to-low transition on AVD, AVD may remain low as long as the address is stable.
2. CLK may be static high or static low.
Asynchronous Read Cycle Waveform(1)(2)(3)(4)
A0 - A22
tRC
ADDRESS VALID
CE
tCE
OE
tOE
tACC2
tDF
tOH
RESET
tRO
I/O0 - I/O15
HIGH Z
OUTPUT
VALID
Notes:
1. CE may be delayed up to tACC - tCE after the address transition without impact on tACC.
2. OE may be delayed up to tCE - tOE after the falling edge of CE without impact on tCE or by tACC - tOE after an address change
without impact on tACC.
3. tDF is specified from OE or CE, whichever occurs first (CL = 5 pF).
4. AVD and CLK should be tied low.
28 AT49SN/SV12804 [Preliminary]
3314A–FLASH–4/04