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ATC35 Datasheet, PDF (1/14 Pages) ATMEL Corporation – Cell-based ASIC
Features
• Comprehensive Library of Standard Logic Cells
• ATC35 I/O Cells Designed to Operate with VDD = 3.3V ± 0.3V as Main Target Operating
Conditions
• IO35 Pad Library Provides Interface to 5V Environment
• Oscillators and Phase Locked Loops for Stable Clock Sources
• Memory Cells Compiled to the Precise Requirements of the Design
• Compatible with Atmel’s Extensive Range of Microcontroller, DSP, Standard Interface
and Application Specific Cells
• High-Performance Analog Cells can be Developed on Request
Description
The Atmel ATC35 (AT56K) process is a proprietary 0.35 micron three-layer-metal
CMOS process intended for use with a supply voltage of 3.3V ± 0.3V. The following
table shows the range for which Atmel library cells have been characterized.
Table 1. Recommended Operating Conditions
Symbol
Parameter
Conditions
VDD3
VDD5
VI
VO
TEMP
DC Supply Voltage
DC Supply Voltage
DC Input Voltage
DC Output Voltage
Operating Free Air
Temperature Range
Core and Standard I/Os
5V Interface I/Os
Industrial
Min Typ Max Unit
3.0
3.3
3.6
V
4.5
5.0
5.5
V
0
VDD
V
0
VDD
V
-55
+85
°C
The Atmel cell libraries and megacell compilers have been designed in order to be
compatible with each other. Simulation representations exist for three types of operat-
ing conditions. They correspond to three characterization conditions defined as
follows:
• MIN conditions:
TJ = -55°C
VDD (cell) = 3.60V
Process = fast (industrial best case)
• TYP conditions:
TJ = +25°C
VDD (cell) = 3.30V
Process = typ (industrial typical case)
• MAX conditions:
TJ = +100°C
VDD (cell) = 3.00V
Process = slow (industrial worst case)
Delays to tristate are defined as delay to turn off (VGS < VT) of the driving devices.
Output pad drain current corresponds to the output current of the pad when the output
voltage is VOL or VOH. The output resistor of the pad and the voltage drop due to
access resistors (in and out of the die) are taken into account. In order to have accu-
rate timing estimates, all characterization has been run on electrical netlists extracted
from the layout database.
Cell-based ASIC
ATC35
Summary
Rev. 1063CS–CBIC–01/03
1